Yang, Z., Wen, L., Li, Y., Zhou, D., Wang, X., Ding, R., . . . Guo, Q. (2024). Analysis of the Interference Effects in CMOS Image Sensors Caused by Strong Electromagnetic Pulses. The Korean Institute of Electromagnetic Engineering and Science.
Chicago Style (17th ed.) CitationYang, Zhikang, et al. Analysis of the Interference Effects in CMOS Image Sensors Caused by Strong Electromagnetic Pulses. The Korean Institute of Electromagnetic Engineering and Science, 2024.
MLA (9th ed.) CitationYang, Zhikang, et al. Analysis of the Interference Effects in CMOS Image Sensors Caused by Strong Electromagnetic Pulses. The Korean Institute of Electromagnetic Engineering and Science, 2024.
Warning: These citations may not always be 100% accurate.