Yang, Z., Wen, L., Li, Y., Zhou, D., Wang, X., Ding, R., . . . Guo, Q. (2024). Analysis of the Interference Effects in CMOS Image Sensors Caused by Strong Electromagnetic Pulses. The Korean Institute of Electromagnetic Engineering and Science.
芝加哥风格引文Yang, Zhikang, et al. Analysis of the Interference Effects in CMOS Image Sensors Caused by Strong Electromagnetic Pulses. The Korean Institute of Electromagnetic Engineering and Science, 2024.
MLA引文Yang, Zhikang, et al. Analysis of the Interference Effects in CMOS Image Sensors Caused by Strong Electromagnetic Pulses. The Korean Institute of Electromagnetic Engineering and Science, 2024.
警告：这些引文格式不一定是100％准确.