Analysis of the Interference Effects in CMOS Image Sensors Caused by Strong Electromagnetic Pulses
With the electromagnetic environment becoming increasingly complex, it is crucial to address the risk posed by electromagnetic pulse, which critically impairs the performance and reliability of electronic systems based on complementary metal oxide semiconductor (CMOS) image sensors. In this context,...
| Egile Nagusiak: | , , , , , , , , , |
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| Formatua: | Artikulua |
| Hizkuntza: | English |
| Argitaratua: |
The Korean Institute of Electromagnetic Engineering and Science
2024-03-01
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| Saila: | Journal of Electromagnetic Engineering and Science |
| Gaiak: | |
| Sarrera elektronikoa: | https://www.jees.kr/upload/pdf/jees-2024-2-r-215.pdf |