Improved Charge Transfer Contribution by Cosputtering Ag and ZnO

A two-dimensional polystyrene microsphere array cosputtered with Ag and ZnO was designed for evaluating surface-enhanced Raman scattering (SERS) activity. The surface plasmon resonance (SPR) and SERS properties were significantly changed by the introduction of ZnO into the Ag film. By increasing the...

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Main Authors: Bingbing Han, Shuang Guo, Sila Jin, Eungyeong Park, Xiangxin Xue, Lei Chen, Young Mee Jung
Format: Article
Language:English
Published: MDPI AG 2020-07-01
Series:Nanomaterials
Subjects:
Online Access:https://www.mdpi.com/2079-4991/10/8/1455
_version_ 1797561404730900480
author Bingbing Han
Shuang Guo
Sila Jin
Eungyeong Park
Xiangxin Xue
Lei Chen
Young Mee Jung
author_facet Bingbing Han
Shuang Guo
Sila Jin
Eungyeong Park
Xiangxin Xue
Lei Chen
Young Mee Jung
author_sort Bingbing Han
collection DOAJ
description A two-dimensional polystyrene microsphere array cosputtered with Ag and ZnO was designed for evaluating surface-enhanced Raman scattering (SERS) activity. The surface plasmon resonance (SPR) and SERS properties were significantly changed by the introduction of ZnO into the Ag film. By increasing the Ag sputtering power, a redshift of the SPR peak was obtained. Moreover, improved SERS activity occurred because of the electromagnetic (EM) contribution from the increasing Ag content and the charge transfer (CT) contribution from the introduction of ZnO. More importantly, the Hall effect was employed to evaluate the carrier density effect on the SERS contribution of the Ag/ZnO film. The increase in the carrier density as the Ag sputtering power increased indicated an increasing number of free electrons stored in the Ag/ZnO film, which was accompanied by improved EM and CT contributions.
first_indexed 2024-03-10T18:13:29Z
format Article
id doaj.art-dd3c3ae8accb4715bd8f48da1ce8449c
institution Directory Open Access Journal
issn 2079-4991
language English
last_indexed 2024-03-10T18:13:29Z
publishDate 2020-07-01
publisher MDPI AG
record_format Article
series Nanomaterials
spelling doaj.art-dd3c3ae8accb4715bd8f48da1ce8449c2023-11-20T07:55:24ZengMDPI AGNanomaterials2079-49912020-07-01108145510.3390/nano10081455Improved Charge Transfer Contribution by Cosputtering Ag and ZnOBingbing Han0Shuang Guo1Sila Jin2Eungyeong Park3Xiangxin Xue4Lei Chen5Young Mee Jung6Key Laboratory of Preparation and Applications of Environmental Friendly Materials, Jilin Normal University, Ministry of Education, Changchun 130103, ChinaDepartment of Chemistry, Institute for Molecular Science and Fusion Technology, Kangwon National University, Chunchon 24341, KoreaDepartment of Chemistry, Institute for Molecular Science and Fusion Technology, Kangwon National University, Chunchon 24341, KoreaDepartment of Chemistry, Institute for Molecular Science and Fusion Technology, Kangwon National University, Chunchon 24341, KoreaKey Laboratory of Preparation and Applications of Environmental Friendly Materials, Jilin Normal University, Ministry of Education, Changchun 130103, ChinaKey Laboratory of Preparation and Applications of Environmental Friendly Materials, Jilin Normal University, Ministry of Education, Changchun 130103, ChinaDepartment of Chemistry, Institute for Molecular Science and Fusion Technology, Kangwon National University, Chunchon 24341, KoreaA two-dimensional polystyrene microsphere array cosputtered with Ag and ZnO was designed for evaluating surface-enhanced Raman scattering (SERS) activity. The surface plasmon resonance (SPR) and SERS properties were significantly changed by the introduction of ZnO into the Ag film. By increasing the Ag sputtering power, a redshift of the SPR peak was obtained. Moreover, improved SERS activity occurred because of the electromagnetic (EM) contribution from the increasing Ag content and the charge transfer (CT) contribution from the introduction of ZnO. More importantly, the Hall effect was employed to evaluate the carrier density effect on the SERS contribution of the Ag/ZnO film. The increase in the carrier density as the Ag sputtering power increased indicated an increasing number of free electrons stored in the Ag/ZnO film, which was accompanied by improved EM and CT contributions.https://www.mdpi.com/2079-4991/10/8/1455SERSSPRCTEMAg/ZnO film
spellingShingle Bingbing Han
Shuang Guo
Sila Jin
Eungyeong Park
Xiangxin Xue
Lei Chen
Young Mee Jung
Improved Charge Transfer Contribution by Cosputtering Ag and ZnO
Nanomaterials
SERS
SPR
CT
EM
Ag/ZnO film
title Improved Charge Transfer Contribution by Cosputtering Ag and ZnO
title_full Improved Charge Transfer Contribution by Cosputtering Ag and ZnO
title_fullStr Improved Charge Transfer Contribution by Cosputtering Ag and ZnO
title_full_unstemmed Improved Charge Transfer Contribution by Cosputtering Ag and ZnO
title_short Improved Charge Transfer Contribution by Cosputtering Ag and ZnO
title_sort improved charge transfer contribution by cosputtering ag and zno
topic SERS
SPR
CT
EM
Ag/ZnO film
url https://www.mdpi.com/2079-4991/10/8/1455
work_keys_str_mv AT bingbinghan improvedchargetransfercontributionbycosputteringagandzno
AT shuangguo improvedchargetransfercontributionbycosputteringagandzno
AT silajin improvedchargetransfercontributionbycosputteringagandzno
AT eungyeongpark improvedchargetransfercontributionbycosputteringagandzno
AT xiangxinxue improvedchargetransfercontributionbycosputteringagandzno
AT leichen improvedchargetransfercontributionbycosputteringagandzno
AT youngmeejung improvedchargetransfercontributionbycosputteringagandzno