DEFORMATION MONITORING USING SAR INTERFEROMETRY AND ACTIVE AND PASSIVE REFLECTORS

This paper is focused on SAR interferometry for deformation monitoring, based on the use of passive and active reflectors. Such reflectors are needed in all cases where a sufficient response from the ground is not available. In particular, the paper describes the development of a low-cost active ref...

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Bibliographic Details
Main Authors: M. Crosetto, G. Luzi, O. Monserrat, A. Barra, M. Cuevas-González, R. Palamá, V. Krishnakumar, Y. Wassie, S. M. Mirmazloumi, P. Espín-López, B. Crippa
Format: Article
Language:English
Published: Copernicus Publications 2020-08-01
Series:The International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences
Online Access:https://www.int-arch-photogramm-remote-sens-spatial-inf-sci.net/XLIII-B3-2020/287/2020/isprs-archives-XLIII-B3-2020-287-2020.pdf
Description
Summary:This paper is focused on SAR interferometry for deformation monitoring, based on the use of passive and active reflectors. Such reflectors are needed in all cases where a sufficient response from the ground is not available. In particular, the paper describes the development of a low-cost active reflector. This development was carried out in an EU H2020 project called GIMS. The paper summarizes the key characteristics of the developed active reflector. The reflector was tested in two main experiments: the first one located in the campus of CTTC and the second one in a GIMS test site located in Slovenia. The experiments demonstrate the visibility of the active reflectors and provide the first results concerning the phase stability of such devices.
ISSN:1682-1750
2194-9034