New Design Procedure to Determine the Taper Transition for Impedance Matching Between Microstrip Line and SIW Component

New Design Procedure to Determine the Taper Transition for Impedance Matching Between Microstrip Line and SIW Component

Abstract Normally the physical dimensions of the taper transition that realizes the impedance matching between the impedance of the feeding line built in microstrip line technology and the impedance of the component built in Substrate Integrated Waveguide (SIW) technology are obtained by computation...

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Bibliographic Details
Main Author:	Ricardo Caranicola Caleffo
Format:	Article
Language:	English
Published:	Sociedade Brasileira de Microondas e Optoeletrônica; Sociedade Brasileira de Eletromagnetismo
Series:	Journal of Microwaves, Optoelectronics and Electromagnetic Applications
Subjects:	Planar circuits SIW technology Taper transitions
Online Access:	http://www.scielo.br/scielo.php?script=sci_arttext&pid=S2179-10742016000300247&lng=en&tlng=en

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