Ponderings on the Possible Preponderance of Perpendicular Planets

Misalignments between planetary orbits and the equatorial planes of their host stars are clues about the formation and evolution of planetary systems. Earlier work found evidence for a peak near 90° in the distribution of stellar obliquities, based on frequentist tests. We performed hierarchical Bay...

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Bibliographic Details
Main Authors: Jared C. Siegel, Joshua N. Winn, Simon H. Albrecht
Format: Article
Language:English
Published: IOP Publishing 2023-01-01
Series:The Astrophysical Journal Letters
Subjects:
Online Access:https://doi.org/10.3847/2041-8213/acd62f
Description
Summary:Misalignments between planetary orbits and the equatorial planes of their host stars are clues about the formation and evolution of planetary systems. Earlier work found evidence for a peak near 90° in the distribution of stellar obliquities, based on frequentist tests. We performed hierarchical Bayesian inference on a sample of 174 planets for which either the full three-dimensional stellar obliquity has been measured (72 planets) or for which only the sky-projected stellar obliquity has been measured (102 planets). We investigated whether the obliquities are best described by a Rayleigh distribution or by a mixture of a Rayleigh distribution representing well-aligned systems and a different distribution representing misaligned systems. The mixture models are strongly favored over the single-component distribution. For the misaligned component, we tried an isotropic distribution and a distribution peaked at 90° and found the evidence to be essentially the same for both models. Thus, our Bayesian inference engine did not find strong evidence favoring a “perpendicular peak,” unlike the frequentist tests. We also investigated selection biases that affect the inferred obliquity distribution, such as the bias of the gravity-darkening method against obliquities near 0° or 180°. Further progress in characterizing the obliquity distribution will probably require the construction of a more homogeneous and complete sample of measurements.
ISSN:2041-8205