Determination of stoichiometry deviation in wide-band II–VI semiconductors on the basis of equilibrium vapor phase composition
A method has been suggested for determining stoichiometry deviation in cadmium and zinc chalcogenides based on the temperature dependence of the ratio of components partial pressures during evaporation of solid compounds in a limited volume. The new method differs from methods implying the collectio...
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| Format: | Article |
| Language: | English |
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Pensoft Publishers
2022-06-01
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| Series: | Modern Electronic Materials |
| Online Access: | https://moem.pensoft.net/article/90174/download/pdf/ |
| _version_ | 1797758273951105024 |
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| author | Svetlana P. Kobeleva |
| author_facet | Svetlana P. Kobeleva |
| author_sort | Svetlana P. Kobeleva |
| collection | DOAJ |
| description | A method has been suggested for determining stoichiometry deviation in cadmium and zinc chalcogenides based on the temperature dependence of the ratio of components partial pressures during evaporation of solid compounds in a limited volume. The new method differs from methods implying the collection of excessive component during evaporation in large volumes. The method includes measuring the partial pressures of vapor phase components during material heating to above 800 K, solving a set of material balance equations and the electric neutrality equation, and calculating the stoichiometry deviation in the initial compound at room temperature. Intrinsic point defect concentrations are calculated using the method of quasichemical reactions. The independent variables in the set of material balance equations are the sought stoichiometry deviation, the partial pressure of the metal and the concentration of free electrons. We show that the parameter of the material balance equation which determines the method’s sensitivity to stoichiometry deviation, i.e., the volume ratio of vapor and solid phases, can be considered constant during heating and evaporation if this parameter does not exceed 50. If the partial pressure is measured based on the optical density of the vapors, then the sensitivity of the method can be increased to not worse than 10–6 at.%. |
| first_indexed | 2024-03-12T18:27:30Z |
| format | Article |
| id | doaj.art-de9d89f16745462cb46e066273c13fe7 |
| institution | Directory Open Access Journal |
| issn | 2452-1779 |
| language | English |
| last_indexed | 2024-03-12T18:27:30Z |
| publishDate | 2022-06-01 |
| publisher | Pensoft Publishers |
| record_format | Article |
| series | Modern Electronic Materials |
| spelling | doaj.art-de9d89f16745462cb46e066273c13fe72023-08-02T08:28:18ZengPensoft PublishersModern Electronic Materials2452-17792022-06-0182596410.3897/j.moem.8.2.9017490174Determination of stoichiometry deviation in wide-band II–VI semiconductors on the basis of equilibrium vapor phase compositionSvetlana P. Kobeleva0National University of Science and TechnologyA method has been suggested for determining stoichiometry deviation in cadmium and zinc chalcogenides based on the temperature dependence of the ratio of components partial pressures during evaporation of solid compounds in a limited volume. The new method differs from methods implying the collection of excessive component during evaporation in large volumes. The method includes measuring the partial pressures of vapor phase components during material heating to above 800 K, solving a set of material balance equations and the electric neutrality equation, and calculating the stoichiometry deviation in the initial compound at room temperature. Intrinsic point defect concentrations are calculated using the method of quasichemical reactions. The independent variables in the set of material balance equations are the sought stoichiometry deviation, the partial pressure of the metal and the concentration of free electrons. We show that the parameter of the material balance equation which determines the method’s sensitivity to stoichiometry deviation, i.e., the volume ratio of vapor and solid phases, can be considered constant during heating and evaporation if this parameter does not exceed 50. If the partial pressure is measured based on the optical density of the vapors, then the sensitivity of the method can be increased to not worse than 10–6 at.%.https://moem.pensoft.net/article/90174/download/pdf/ |
| spellingShingle | Svetlana P. Kobeleva Determination of stoichiometry deviation in wide-band II–VI semiconductors on the basis of equilibrium vapor phase composition Modern Electronic Materials |
| title | Determination of stoichiometry deviation in wide-band II–VI semiconductors on the basis of equilibrium vapor phase composition |
| title_full | Determination of stoichiometry deviation in wide-band II–VI semiconductors on the basis of equilibrium vapor phase composition |
| title_fullStr | Determination of stoichiometry deviation in wide-band II–VI semiconductors on the basis of equilibrium vapor phase composition |
| title_full_unstemmed | Determination of stoichiometry deviation in wide-band II–VI semiconductors on the basis of equilibrium vapor phase composition |
| title_short | Determination of stoichiometry deviation in wide-band II–VI semiconductors on the basis of equilibrium vapor phase composition |
| title_sort | determination of stoichiometry deviation in wide band ii vi semiconductors on the basis of equilibrium vapor phase composition |
| url | https://moem.pensoft.net/article/90174/download/pdf/ |
| work_keys_str_mv | AT svetlanapkobeleva determinationofstoichiometrydeviationinwidebandiivisemiconductorsonthebasisofequilibriumvaporphasecomposition |