Microshape Measurement Method Using Speckle Interferometry Based on Phase Analysis

A method for the measurement of the shape of a fine structure beyond the diffraction limit based on speckle interferometry has been reported. In this paper, the mechanism for measuring the shape of the fine structure in speckle interferometry using scattered light as the illumination light is discus...

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Bibliographic Details
Main Author: Yasuhiko Arai
Format: Article
Language:English
Published: MDPI AG 2021-04-01
Series:Photonics
Subjects:
Online Access:https://www.mdpi.com/2304-6732/8/4/112