Total Variation Regularization Term-Based Low-Rank and Sparse Matrix Representation Model for Infrared Moving Target Tracking

Infrared moving target tracking plays a fundamental role in many burgeoning research areas of Smart City. Challenges in developing a suitable tracker for infrared images are particularly caused by pose variation, occlusion, and noise. In order to overcome these adverse interferences, a total variati...

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Bibliographic Details
Main Authors: Minjie Wan, Guohua Gu, Weixian Qian, Kan Ren, Qian Chen, Hai Zhang, Xavier Maldague
Format: Article
Language:English
Published: MDPI AG 2018-03-01
Series:Remote Sensing
Subjects:
Online Access:http://www.mdpi.com/2072-4292/10/4/510
Description
Summary:Infrared moving target tracking plays a fundamental role in many burgeoning research areas of Smart City. Challenges in developing a suitable tracker for infrared images are particularly caused by pose variation, occlusion, and noise. In order to overcome these adverse interferences, a total variation regularization term-based low-rank and sparse matrix representation (TV-LRSMR) model is designed in order to exploit a robust infrared moving target tracker in this paper. First of all, the observation matrix that is derived from the infrared sequence is decomposed into a low-rank target matrix and a sparse occlusion matrix. For the purpose of preventing the noise pixel from being separated into the occlusion term, a total variation regularization term is proposed to further constrain the occlusion matrix. Then an alternating algorithm combing principal component analysis and accelerated proximal gradient methods is employed to separately optimize the two matrices. For long-term tracking, the presented algorithm is implemented using a Bayesien state inference under the particle filtering framework along with a dynamic model update mechanism. Both qualitative and quantitative experiments that were examined on real infrared video sequences verify that our algorithm outperforms other state-of-the-art methods in terms of precision rate and success rate.
ISSN:2072-4292