Optical conductivity of Ni1 − xPtx alloys (0<x<0.25) from 0.76 to 6.6 eV

Using spectroscopic ellipsometry and Drude-Lorentz oscillator fitting, we determined the dielectric function and optical conductivity versus photon energy from 0.76 to 6.6 eV of 10 nm thick Ni1 − xPtx alloy (0<x<0.25) films deposited on thick thermal oxides. We find absorption peaks near 1.6 a...

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Bibliographic Details
Main Authors: Lina S. Abdallah, Tarek M. Tawalbeh, Igor V. Vasiliev, Stefan Zollner, Christian Lavoie, Ahmet Ozcan, Mark Raymond
Format: Article
Language:English
Published: AIP Publishing LLC 2014-01-01
Series:AIP Advances
Online Access:http://dx.doi.org/10.1063/1.4861214
Description
Summary:Using spectroscopic ellipsometry and Drude-Lorentz oscillator fitting, we determined the dielectric function and optical conductivity versus photon energy from 0.76 to 6.6 eV of 10 nm thick Ni1 − xPtx alloy (0<x<0.25) films deposited on thick thermal oxides. We find absorption peaks near 1.6 and 5.0 eV due to interband optical transitions. There is a significant broadening of the UV peak with increasing Pt content, since the bandwidth of the 3d electrons in Ni is smaller than that of the 5d bands in Pt. Our experimental observation is consistent with ab initio calculations of the density of states for Ni, Pt, and the Ni3Pt compound. Annealing the metals at 500°C for 30 s increases the optical conductivity.
ISSN:2158-3226