Mitigation and Predictive Assessment of SET Immunity of Digital Logic Circuits for Space Missions
Due to the intrinsic masking effects of combinational circuits in digital designs, Single-Event Transient (SET) effects were considered irrelevant compared to the data rupture caused by Single-Event Upset (SEU) effects. However, the importance of considering SET in Very-Large-System-Integration (VLS...
Main Authors: | Ygor Q. Aguiar, Frédéric Wrobel, Jean-Luc Autran, Paul Leroux, Frédéric Saigné, Vincent Pouget, Antoine D. Touboul |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2020-02-01
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Series: | Aerospace |
Subjects: | |
Online Access: | https://www.mdpi.com/2226-4310/7/2/12 |
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