Noise-robust classification of single-shot electron spin readouts using a deep neural network
Abstract Single-shot readout of charge and spin states by charge sensors such as quantum point contacts and quantum dots are essential technologies for the operation of semiconductor spin qubits. The fidelity of the single-shot readout depends both on experimental conditions such as signal-to-noise...
Main Authors: | Yuta Matsumoto, Takafumi Fujita, Arne Ludwig, Andreas D. Wieck, Kazunori Komatani, Akira Oiwa |
---|---|
Format: | Article |
Language: | English |
Published: |
Nature Portfolio
2021-09-01
|
Series: | npj Quantum Information |
Online Access: | https://doi.org/10.1038/s41534-021-00470-7 |
Similar Items
-
Single-shot spin readout in semiconductors near the shot-noise sensitivity limit
by: Keith, D., et al.
Published: (2020) -
Single-Shot Spin Readout in Semiconductors Near the Shot-Noise Sensitivity Limit
by: D. Keith, et al.
Published: (2019-10-01) -
Cavity-enhanced single-shot readout of a quantum dot spin within 3 nanoseconds
by: Nadia O. Antoniadis, et al.
Published: (2023-07-01) -
Single-Shot Spin Readout in Graphene Quantum Dots
by: Lisa Maria Gächter, et al.
Published: (2022-05-01) -
Angular momentum transfer from photon polarization to an electron spin in a gate-defined quantum dot
by: Takafumi Fujita, et al.
Published: (2019-07-01)