Construction and application of march tests for pattern sensitive memory faults detection
The urgency of the problem of testing storage devices of modern computer systems is shown. The mathematical models of their faults and the methods used for testing the most complex cases by classical march tests are investigated. Passive pattern sensitive faults (PNPSFk) are allocated, in which arbi...
| Main Authors: | , , , |
|---|---|
| Format: | Article |
| Language: | Russian |
| Published: |
The United Institute of Informatics Problems of the National Academy of Sciences of Belarus
2021-03-01
|
| Series: | Informatika |
| Subjects: | |
| Online Access: | https://inf.grid.by/jour/article/view/1117 |
| _version_ | 1797877199181709312 |
|---|---|
| author | V. N. Yarmolik V. A. Levantsevich D. V. Demenkovets I. Mrozek |
| author_facet | V. N. Yarmolik V. A. Levantsevich D. V. Demenkovets I. Mrozek |
| author_sort | V. N. Yarmolik |
| collection | DOAJ |
| description | The urgency of the problem of testing storage devices of modern computer systems is shown. The mathematical models of their faults and the methods used for testing the most complex cases by classical march tests are investigated. Passive pattern sensitive faults (PNPSFk) are allocated, in which arbitrary k from N memory cells participate, where k << N, and N is the memory capacity in bits. For these faults, analytical expressions are given for the minimum and maximum fault coverage that is achievable within the march tests. The concept of a primitive is defined, which describes in terms of march test elements the conditions for activation and fault detection of PNPSFk of storage devices. Examples of march tests with maximum fault coverage, as well as march tests with a minimum time complexity equal to 18N are given. The efficiency of a single application of tests such as MATS ++, March C− and March PS is investigated for different number of k ≤ 9 memory cells involved in PNPSFk fault. The applicability of multiple testing with variable address sequences is substantiated, when the use of random sequences of addresses is proposed. Analytical expressions are given for the fault coverage of complex PNPSFk faults depending on the multiplicity of the test. In addition, the estimates of the mean value of the multiplicity of the MATS++, March C− and March PS tests, obtained on the basis of a mathematical model describing the problem of the coupon collector, and ensuring the detection of all k2k PNPSFk faults are given. The validity of analytical estimates is experimentally shown and the high efficiency of PNPSFk fault detection is confirmed by tests of the March PS type. |
| first_indexed | 2024-04-10T02:14:29Z |
| format | Article |
| id | doaj.art-e0805fd72312442aa4b7fcdb3d911983 |
| institution | Directory Open Access Journal |
| issn | 1816-0301 |
| language | Russian |
| last_indexed | 2024-04-10T02:14:29Z |
| publishDate | 2021-03-01 |
| publisher | The United Institute of Informatics Problems of the National Academy of Sciences of Belarus |
| record_format | Article |
| series | Informatika |
| spelling | doaj.art-e0805fd72312442aa4b7fcdb3d9119832023-03-13T08:32:24ZrusThe United Institute of Informatics Problems of the National Academy of Sciences of BelarusInformatika1816-03012021-03-01181254210.37661/1816-0301-2021-18-1-25-42957Construction and application of march tests for pattern sensitive memory faults detectionV. N. Yarmolik0V. A. Levantsevich1D. V. Demenkovets2I. Mrozek3Belarusian State University of Informatics and RadioelectronicsBelarusian State University of Informatics and RadioelectronicsBelarusian State University of Informatics and RadioelectronicsBialystok University of TechnologyThe urgency of the problem of testing storage devices of modern computer systems is shown. The mathematical models of their faults and the methods used for testing the most complex cases by classical march tests are investigated. Passive pattern sensitive faults (PNPSFk) are allocated, in which arbitrary k from N memory cells participate, where k << N, and N is the memory capacity in bits. For these faults, analytical expressions are given for the minimum and maximum fault coverage that is achievable within the march tests. The concept of a primitive is defined, which describes in terms of march test elements the conditions for activation and fault detection of PNPSFk of storage devices. Examples of march tests with maximum fault coverage, as well as march tests with a minimum time complexity equal to 18N are given. The efficiency of a single application of tests such as MATS ++, March C− and March PS is investigated for different number of k ≤ 9 memory cells involved in PNPSFk fault. The applicability of multiple testing with variable address sequences is substantiated, when the use of random sequences of addresses is proposed. Analytical expressions are given for the fault coverage of complex PNPSFk faults depending on the multiplicity of the test. In addition, the estimates of the mean value of the multiplicity of the MATS++, March C− and March PS tests, obtained on the basis of a mathematical model describing the problem of the coupon collector, and ensuring the detection of all k2k PNPSFk faults are given. The validity of analytical estimates is experimentally shown and the high efficiency of PNPSFk fault detection is confirmed by tests of the March PS type.https://inf.grid.by/jour/article/view/1117testing of computer systemsstorage devicesmarch tests of memorymultiple testingcoupon collector problem |
| spellingShingle | V. N. Yarmolik V. A. Levantsevich D. V. Demenkovets I. Mrozek Construction and application of march tests for pattern sensitive memory faults detection Informatika testing of computer systems storage devices march tests of memory multiple testing coupon collector problem |
| title | Construction and application of march tests for pattern sensitive memory faults detection |
| title_full | Construction and application of march tests for pattern sensitive memory faults detection |
| title_fullStr | Construction and application of march tests for pattern sensitive memory faults detection |
| title_full_unstemmed | Construction and application of march tests for pattern sensitive memory faults detection |
| title_short | Construction and application of march tests for pattern sensitive memory faults detection |
| title_sort | construction and application of march tests for pattern sensitive memory faults detection |
| topic | testing of computer systems storage devices march tests of memory multiple testing coupon collector problem |
| url | https://inf.grid.by/jour/article/view/1117 |
| work_keys_str_mv | AT vnyarmolik constructionandapplicationofmarchtestsforpatternsensitivememoryfaultsdetection AT valevantsevich constructionandapplicationofmarchtestsforpatternsensitivememoryfaultsdetection AT dvdemenkovets constructionandapplicationofmarchtestsforpatternsensitivememoryfaultsdetection AT imrozek constructionandapplicationofmarchtestsforpatternsensitivememoryfaultsdetection |