Contribution of Ex-Situ and In-Situ X-ray Grazing Incidence Scattering Techniques to the Understanding of Quantum Dot Self-Assembly: A Review
Quantum dots are under intense research, given their amazing properties which favor their use in electronics, optoelectronics, energy, medicine and other important applications. For many of these technological applications, quantum dots are used in their ordered self-assembled form, called superlatt...
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| Format: | Article |
| Language: | English |
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MDPI AG
2020-11-01
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| Series: | Nanomaterials |
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| Online Access: | https://www.mdpi.com/2079-4991/10/11/2240 |
| _version_ | 1827702435859136512 |
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| author | Vishesh Saxena Giuseppe Portale |
| author_facet | Vishesh Saxena Giuseppe Portale |
| author_sort | Vishesh Saxena |
| collection | DOAJ |
| description | Quantum dots are under intense research, given their amazing properties which favor their use in electronics, optoelectronics, energy, medicine and other important applications. For many of these technological applications, quantum dots are used in their ordered self-assembled form, called superlattice. Understanding the mechanism of formation of the superlattices is crucial to designing quantum dots devices with desired properties. Here we review some of the most important findings about the formation of such superlattices that have been derived using grazing incidence scattering techniques (grazing incidence small and wide angle X-ray scattering (GISAXS/GIWAXS)). Acquisition of these structural information is essential to developing some of the most important underlying theories in the field. |
| first_indexed | 2024-03-10T14:55:22Z |
| format | Article |
| id | doaj.art-e093d15370f948c5b6bf8e1ca30cf359 |
| institution | Directory Open Access Journal |
| issn | 2079-4991 |
| language | English |
| last_indexed | 2024-03-10T14:55:22Z |
| publishDate | 2020-11-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Nanomaterials |
| spelling | doaj.art-e093d15370f948c5b6bf8e1ca30cf3592023-11-20T20:40:29ZengMDPI AGNanomaterials2079-49912020-11-011011224010.3390/nano10112240Contribution of Ex-Situ and In-Situ X-ray Grazing Incidence Scattering Techniques to the Understanding of Quantum Dot Self-Assembly: A ReviewVishesh Saxena0Giuseppe Portale1Zernike Institute for Advanced Materials, University of Groningen, Nijenborgh 4, Groningen AG 9747, The NetherlandsMacromolecular Chemistry and New Polymeric Material, Zernike Institute for Advanced Materials, University of Groningen, Nijenborgh 4, Groningen AG 9747, The NetherlandsQuantum dots are under intense research, given their amazing properties which favor their use in electronics, optoelectronics, energy, medicine and other important applications. For many of these technological applications, quantum dots are used in their ordered self-assembled form, called superlattice. Understanding the mechanism of formation of the superlattices is crucial to designing quantum dots devices with desired properties. Here we review some of the most important findings about the formation of such superlattices that have been derived using grazing incidence scattering techniques (grazing incidence small and wide angle X-ray scattering (GISAXS/GIWAXS)). Acquisition of these structural information is essential to developing some of the most important underlying theories in the field.https://www.mdpi.com/2079-4991/10/11/2240GISAXSGIWAXSquantum dotself-assemblygrazing incidence scatteringsuperlattices |
| spellingShingle | Vishesh Saxena Giuseppe Portale Contribution of Ex-Situ and In-Situ X-ray Grazing Incidence Scattering Techniques to the Understanding of Quantum Dot Self-Assembly: A Review Nanomaterials GISAXS GIWAXS quantum dot self-assembly grazing incidence scattering superlattices |
| title | Contribution of Ex-Situ and In-Situ X-ray Grazing Incidence Scattering Techniques to the Understanding of Quantum Dot Self-Assembly: A Review |
| title_full | Contribution of Ex-Situ and In-Situ X-ray Grazing Incidence Scattering Techniques to the Understanding of Quantum Dot Self-Assembly: A Review |
| title_fullStr | Contribution of Ex-Situ and In-Situ X-ray Grazing Incidence Scattering Techniques to the Understanding of Quantum Dot Self-Assembly: A Review |
| title_full_unstemmed | Contribution of Ex-Situ and In-Situ X-ray Grazing Incidence Scattering Techniques to the Understanding of Quantum Dot Self-Assembly: A Review |
| title_short | Contribution of Ex-Situ and In-Situ X-ray Grazing Incidence Scattering Techniques to the Understanding of Quantum Dot Self-Assembly: A Review |
| title_sort | contribution of ex situ and in situ x ray grazing incidence scattering techniques to the understanding of quantum dot self assembly a review |
| topic | GISAXS GIWAXS quantum dot self-assembly grazing incidence scattering superlattices |
| url | https://www.mdpi.com/2079-4991/10/11/2240 |
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