Electric-field noise above a thin dielectric layer on metal electrodes
The electric-field noise above a layered structure composed of a planar metal electrode covered by a thin dielectric is evaluated and it is found that the dielectric film considerably increases the noise level, in proportion to its thickness. Importantly, even a thin (mono) layer of a low-loss diele...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
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IOP Publishing
2016-01-01
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| Series: | New Journal of Physics |
| Subjects: | |
| Online Access: | https://doi.org/10.1088/1367-2630/18/2/023020 |
| _version_ | 1797750861229719552 |
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| author | Muir Kumph Carsten Henkel Peter Rabl Michael Brownnutt Rainer Blatt |
| author_facet | Muir Kumph Carsten Henkel Peter Rabl Michael Brownnutt Rainer Blatt |
| author_sort | Muir Kumph |
| collection | DOAJ |
| description | The electric-field noise above a layered structure composed of a planar metal electrode covered by a thin dielectric is evaluated and it is found that the dielectric film considerably increases the noise level, in proportion to its thickness. Importantly, even a thin (mono) layer of a low-loss dielectric can enhance the noise level by several orders of magnitude compared to the noise above a bare metal. Close to this layered surface, the power spectral density of the electric field varies with the inverse fourth power of the distance to the surface, rather than with the inverse square, as it would above a bare metal surface. Furthermore, compared to a clean metal, where the noise spectrum does not vary with frequency (in the radio-wave and microwave bands), the dielectric layer can generate electric-field noise which scales in inverse proportion to the frequency. For various realistic scenarios, the noise levels predicted from this model are comparable to those observed in trapped-ion experiments. Thus, these findings are of particular importance for the understanding and mitigation of unwanted heating and decoherence in miniaturized ion traps. |
| first_indexed | 2024-03-12T16:38:56Z |
| format | Article |
| id | doaj.art-e0a7e8de1dce48cfbdf7ce0587e07794 |
| institution | Directory Open Access Journal |
| issn | 1367-2630 |
| language | English |
| last_indexed | 2024-03-12T16:38:56Z |
| publishDate | 2016-01-01 |
| publisher | IOP Publishing |
| record_format | Article |
| series | New Journal of Physics |
| spelling | doaj.art-e0a7e8de1dce48cfbdf7ce0587e077942023-08-08T14:36:46ZengIOP PublishingNew Journal of Physics1367-26302016-01-0118202302010.1088/1367-2630/18/2/023020Electric-field noise above a thin dielectric layer on metal electrodesMuir Kumph0Carsten Henkel1https://orcid.org/0000-0002-8468-7502Peter Rabl2Michael Brownnutt3Rainer Blatt4Institut für Quantenoptik und Quanteninformation der Österreichischen Akademie der Wissenschaften , Technikerstrasse 21a, A-6020 Innsbruck, AustriaInstitute of Physics and Astronomy, University of Potsdam , Karl-Liebknecht-Str. 24/25, D-14476 Potsdam, GermanyInstitute of Atomic and Subatomic Physics , TU Wien, Stadionallee 2, A-1020 Vienna, AustriaThe University of Hong Kong , Pok Fu Lam, Hong KongInstitut für Quantenoptik und Quanteninformation der Österreichischen Akademie der Wissenschaften , Technikerstrasse 21a, A-6020 Innsbruck, Austria; Institut für Experimentalphysik, Universität Innsbruck , Technikerstrasse 25, A-6020 Innsbruck, AustriaThe electric-field noise above a layered structure composed of a planar metal electrode covered by a thin dielectric is evaluated and it is found that the dielectric film considerably increases the noise level, in proportion to its thickness. Importantly, even a thin (mono) layer of a low-loss dielectric can enhance the noise level by several orders of magnitude compared to the noise above a bare metal. Close to this layered surface, the power spectral density of the electric field varies with the inverse fourth power of the distance to the surface, rather than with the inverse square, as it would above a bare metal surface. Furthermore, compared to a clean metal, where the noise spectrum does not vary with frequency (in the radio-wave and microwave bands), the dielectric layer can generate electric-field noise which scales in inverse proportion to the frequency. For various realistic scenarios, the noise levels predicted from this model are comparable to those observed in trapped-ion experiments. Thus, these findings are of particular importance for the understanding and mitigation of unwanted heating and decoherence in miniaturized ion traps.https://doi.org/10.1088/1367-2630/18/2/023020ion trapelectric field noisefluctuation dissipation |
| spellingShingle | Muir Kumph Carsten Henkel Peter Rabl Michael Brownnutt Rainer Blatt Electric-field noise above a thin dielectric layer on metal electrodes New Journal of Physics ion trap electric field noise fluctuation dissipation |
| title | Electric-field noise above a thin dielectric layer on metal electrodes |
| title_full | Electric-field noise above a thin dielectric layer on metal electrodes |
| title_fullStr | Electric-field noise above a thin dielectric layer on metal electrodes |
| title_full_unstemmed | Electric-field noise above a thin dielectric layer on metal electrodes |
| title_short | Electric-field noise above a thin dielectric layer on metal electrodes |
| title_sort | electric field noise above a thin dielectric layer on metal electrodes |
| topic | ion trap electric field noise fluctuation dissipation |
| url | https://doi.org/10.1088/1367-2630/18/2/023020 |
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