Zernike Moment Based Classification of Cosmic Ray Candidate Hits from CMOS Sensors

Reliable tools for artefact rejection and signal classification are a must for cosmic ray detection experiments based on CMOS technology. In this paper, we analyse the fitness of several feature-based statistical classifiers for the classification of particle candidate hits in four categories: spots...

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Main Authors: Olaf Bar, Łukasz Bibrzycki, Michał Niedźwiecki, Marcin Piekarczyk, Krzysztof Rzecki, Tomasz Sośnicki, Sławomir Stuglik, Michał Frontczak, Piotr Homola, David E. Alvarez-Castillo, Thomas Andersen, Arman Tursunov
Format: Article
Language:English
Published: MDPI AG 2021-11-01
Series:Sensors
Subjects:
Online Access:https://www.mdpi.com/1424-8220/21/22/7718
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author Olaf Bar
Łukasz Bibrzycki
Michał Niedźwiecki
Marcin Piekarczyk
Krzysztof Rzecki
Tomasz Sośnicki
Sławomir Stuglik
Michał Frontczak
Piotr Homola
David E. Alvarez-Castillo
Thomas Andersen
Arman Tursunov
author_facet Olaf Bar
Łukasz Bibrzycki
Michał Niedźwiecki
Marcin Piekarczyk
Krzysztof Rzecki
Tomasz Sośnicki
Sławomir Stuglik
Michał Frontczak
Piotr Homola
David E. Alvarez-Castillo
Thomas Andersen
Arman Tursunov
author_sort Olaf Bar
collection DOAJ
description Reliable tools for artefact rejection and signal classification are a must for cosmic ray detection experiments based on CMOS technology. In this paper, we analyse the fitness of several feature-based statistical classifiers for the classification of particle candidate hits in four categories: spots, tracks, worms and artefacts. We use Zernike moments of the image function as feature carriers and propose a preprocessing and denoising scheme to make the feature extraction more efficient. As opposed to convolution neural network classifiers, the feature-based classifiers allow for establishing a connection between features and geometrical properties of candidate hits. Apart from basic classifiers we also consider their ensemble extensions and find these extensions generally better performing than basic versions, with an average recognition accuracy of 88%.
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spelling doaj.art-e0d447a779a44da8978b952d679c14562023-11-23T01:28:37ZengMDPI AGSensors1424-82202021-11-012122771810.3390/s21227718Zernike Moment Based Classification of Cosmic Ray Candidate Hits from CMOS SensorsOlaf Bar0Łukasz Bibrzycki1Michał Niedźwiecki2Marcin Piekarczyk3Krzysztof Rzecki4Tomasz Sośnicki5Sławomir Stuglik6Michał Frontczak7Piotr Homola8David E. Alvarez-Castillo9Thomas Andersen10Arman Tursunov11Institute of Computer Science, Pedagogical University of Krakow, 30-084 Kraków, PolandInstitute of Computer Science, Pedagogical University of Krakow, 30-084 Kraków, PolandDepartment of Computer Science, Cracow University of Technology, 31-155 Kraków, PolandInstitute of Computer Science, Pedagogical University of Krakow, 30-084 Kraków, PolandDepartment of Biocybernetics and Biomedical Engineering, AGH University of Science and Technology, 30-059 Kraków, PolandDepartment of Biocybernetics and Biomedical Engineering, AGH University of Science and Technology, 30-059 Kraków, PolandInstitute of Nuclear Physics, Polish Academy of Sciences, 31-342 Kraków, PolandInstitute of Computer Science, Pedagogical University of Krakow, 30-084 Kraków, PolandInstitute of Nuclear Physics, Polish Academy of Sciences, 31-342 Kraków, PolandInstitute of Nuclear Physics, Polish Academy of Sciences, 31-342 Kraków, PolandNSCIR, Thornbury, ON N0H2P0, CanadaInstitute of Physics, Silesian University in Opava, Bezručovo nám 13, 74601 Opava, Czech RepublicReliable tools for artefact rejection and signal classification are a must for cosmic ray detection experiments based on CMOS technology. In this paper, we analyse the fitness of several feature-based statistical classifiers for the classification of particle candidate hits in four categories: spots, tracks, worms and artefacts. We use Zernike moments of the image function as feature carriers and propose a preprocessing and denoising scheme to make the feature extraction more efficient. As opposed to convolution neural network classifiers, the feature-based classifiers allow for establishing a connection between features and geometrical properties of candidate hits. Apart from basic classifiers we also consider their ensemble extensions and find these extensions generally better performing than basic versions, with an average recognition accuracy of 88%.https://www.mdpi.com/1424-8220/21/22/7718CMOS sensorsfeature-based classificationZernike momentsmachine learningcomputer vision
spellingShingle Olaf Bar
Łukasz Bibrzycki
Michał Niedźwiecki
Marcin Piekarczyk
Krzysztof Rzecki
Tomasz Sośnicki
Sławomir Stuglik
Michał Frontczak
Piotr Homola
David E. Alvarez-Castillo
Thomas Andersen
Arman Tursunov
Zernike Moment Based Classification of Cosmic Ray Candidate Hits from CMOS Sensors
Sensors
CMOS sensors
feature-based classification
Zernike moments
machine learning
computer vision
title Zernike Moment Based Classification of Cosmic Ray Candidate Hits from CMOS Sensors
title_full Zernike Moment Based Classification of Cosmic Ray Candidate Hits from CMOS Sensors
title_fullStr Zernike Moment Based Classification of Cosmic Ray Candidate Hits from CMOS Sensors
title_full_unstemmed Zernike Moment Based Classification of Cosmic Ray Candidate Hits from CMOS Sensors
title_short Zernike Moment Based Classification of Cosmic Ray Candidate Hits from CMOS Sensors
title_sort zernike moment based classification of cosmic ray candidate hits from cmos sensors
topic CMOS sensors
feature-based classification
Zernike moments
machine learning
computer vision
url https://www.mdpi.com/1424-8220/21/22/7718
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