Nonlinear reflection ellipsmetry for an anisotropic uniaxial crystal then optical axis lies in the plane of incidence

Nonlinear reflection ellipsmetry for an anisotropic uniaxial crystal then optical axis lies in the plane of incidence

A new method of ellipsometry was considered Nonlinear ellipsometry, allowing to determine nonlinear characteristic of a medium. Angular spectra of nonlinear reflection ellipsometry for uniaxial crystals such as Beta-Barium Borate, Lithium Niobate, Proustite were calculated and plotted at different...

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Bibliographic Details
Main Authors: N.A. Matveeva, R.V. Schelokov, V.V. Yatsishen
Format: Article
Language:English
Published: Povolzhskiy State University of Telecommunications & Informatics 2013-01-01
Series:Физика волновых процессов и радиотехнические системы
Subjects:
nonlinear optics
nonlinear ellipsometry
anisotropic uniaxial crystal
the second harmonic
Online Access:https://journals.ssau.ru/pwp/article/viewFile/7383/7242

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