Double-Exposure Method with Synchrotron White X-ray for Stress Evaluation of Coarse-Grain Materials
Stress measurements of coarse-grained material are difficult using synchrotron X-ray diffraction because the diffraction patterns of coarse-grained materials are spotty. In addition, the center of the diffraction pattern is unknown for the transmitted X-ray beam. Here, a double-exposure method is pr...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2020-07-01
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| Series: | Quantum Beam Science |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2412-382X/4/3/25 |