iGSE-C<sub>D</sub>&#x2014;An Electric-/Displacement-Field Related Steinmetz Model for Class II Multilayer Ceramic Capacitors Under Low-Frequency Large-Signal Excitation

Multilayer Ceramic Capacitors (MLCCs) are of paramount importance in electronics and ferroelectric Class II dielectrics enable outstanding energy-density values. However, the non-linear dielectric constant and associated low-frequency large-signal excitation losses of Class II MLCCs may cause critic...

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Main Authors: David Menzi, Morris Heller, George Kerridge, Peter Marley, Angela Ellmore, Shmuel Ben-Yaakov, Johann W. Kolar
Format: Article
Language:English
Published: IEEE 2023-01-01
Series:IEEE Open Journal of Power Electronics
Subjects:
Online Access:https://ieeexplore.ieee.org/document/10032790/
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author David Menzi
Morris Heller
George Kerridge
Peter Marley
Angela Ellmore
Shmuel Ben-Yaakov
Johann W. Kolar
author_facet David Menzi
Morris Heller
George Kerridge
Peter Marley
Angela Ellmore
Shmuel Ben-Yaakov
Johann W. Kolar
author_sort David Menzi
collection DOAJ
description Multilayer Ceramic Capacitors (MLCCs) are of paramount importance in electronics and ferroelectric Class II dielectrics enable outstanding energy-density values. However, the non-linear dielectric constant and associated low-frequency large-signal excitation losses of Class II MLCCs may cause critical overheating. A peak-charge based Steinmetz loss model entitled iGSE-C<sub>Q</sub> is known in literature and allows to accurately calculate MLCC low-frequency large-signal excitation losses under various operating conditions including biased and non-sinusoidal excitation voltage waveforms. Such a macroscopic iGSE-C<sub>Q</sub> model, however, is inherently limited to a specific MLCC, and in contrast to Steinmetz loss modeling for ferromagnetic inductor cores, the losses of other devices employing the same dielectric material cannot be predicted. Recent literature therefore proposed a microscopic and/or material specific MLCC Steinmetz Model entitled iGSE-C<sub>D</sub> which allows to calculate the losses of any MLCC of the same dielectric material based upon just a single set of Steinmetz parameters. However, due to the lack of information on the internal device geometry, the iGSE-C<sub>D</sub> could be verified only indirectly so far by means of a loss normalization based on the device capacitance and rated voltage. In this paper, we demonstrate the feasibility of a microscopic iGSE-C<sub>D</sub> MLCC loss model enabled by manufacturer data on the internal capacitor structure. The iGSE-C<sub>D</sub> is verified for two different MLCC series employing a conventional X7R dielectric and a novel Hiteca (with reduced non-linearity) Class II dielectric material with loss estimation error below <inline-formula><tex-math notation="LaTeX">$22\%$</tex-math></inline-formula>. This error results due to component tolerances and is acceptable, especially when compared to the loss calculation based on the datasheet information which can be off by up to a factor of ten. The analysis of the Hiteca dielectric reveals a frequency behavior different to the X7R material, and is discussed in the Appendix of this paper.
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spelling doaj.art-e1a2a8c455444f3987e07b8ebe3ab1f52023-02-15T00:00:59ZengIEEEIEEE Open Journal of Power Electronics2644-13142023-01-01410711610.1109/OJPEL.2023.324083810032790iGSE-C<sub>D</sub>&#x2014;An Electric-/Displacement-Field Related Steinmetz Model for Class II Multilayer Ceramic Capacitors Under Low-Frequency Large-Signal ExcitationDavid Menzi0https://orcid.org/0000-0002-9562-2157Morris Heller1https://orcid.org/0000-0002-5662-9241George Kerridge2https://orcid.org/0000-0002-1964-0572Peter Marley3Angela Ellmore4Shmuel Ben-Yaakov5https://orcid.org/0000-0003-1308-543XJohann W. Kolar6https://orcid.org/0000-0002-6000-7402Power Electronics Systems Laboratory, ETH Zurich, Zurich, SwitzerlandPower Electronics Systems Laboratory, ETH Zurich, Zurich, SwitzerlandKnowles Precision Devices, Norwich, U.K.Knowles Precision Devices, Norwich, U.K.Knowles Precision Devices, Norwich, U.K.Ben-Gurion University of the Negev, Beer-Sheva, IsraelPower Electronics Systems Laboratory, ETH Zurich, Zurich, SwitzerlandMultilayer Ceramic Capacitors (MLCCs) are of paramount importance in electronics and ferroelectric Class II dielectrics enable outstanding energy-density values. However, the non-linear dielectric constant and associated low-frequency large-signal excitation losses of Class II MLCCs may cause critical overheating. A peak-charge based Steinmetz loss model entitled iGSE-C<sub>Q</sub> is known in literature and allows to accurately calculate MLCC low-frequency large-signal excitation losses under various operating conditions including biased and non-sinusoidal excitation voltage waveforms. Such a macroscopic iGSE-C<sub>Q</sub> model, however, is inherently limited to a specific MLCC, and in contrast to Steinmetz loss modeling for ferromagnetic inductor cores, the losses of other devices employing the same dielectric material cannot be predicted. Recent literature therefore proposed a microscopic and/or material specific MLCC Steinmetz Model entitled iGSE-C<sub>D</sub> which allows to calculate the losses of any MLCC of the same dielectric material based upon just a single set of Steinmetz parameters. However, due to the lack of information on the internal device geometry, the iGSE-C<sub>D</sub> could be verified only indirectly so far by means of a loss normalization based on the device capacitance and rated voltage. In this paper, we demonstrate the feasibility of a microscopic iGSE-C<sub>D</sub> MLCC loss model enabled by manufacturer data on the internal capacitor structure. The iGSE-C<sub>D</sub> is verified for two different MLCC series employing a conventional X7R dielectric and a novel Hiteca (with reduced non-linearity) Class II dielectric material with loss estimation error below <inline-formula><tex-math notation="LaTeX">$22\%$</tex-math></inline-formula>. This error results due to component tolerances and is acceptable, especially when compared to the loss calculation based on the datasheet information which can be off by up to a factor of ten. The analysis of the Hiteca dielectric reveals a frequency behavior different to the X7R material, and is discussed in the Appendix of this paper.https://ieeexplore.ieee.org/document/10032790/Multilayer ceramic capacitorMLCCloss modelingSteinmetz EquationiGSEiGSE-C
spellingShingle David Menzi
Morris Heller
George Kerridge
Peter Marley
Angela Ellmore
Shmuel Ben-Yaakov
Johann W. Kolar
iGSE-C<sub>D</sub>&#x2014;An Electric-/Displacement-Field Related Steinmetz Model for Class II Multilayer Ceramic Capacitors Under Low-Frequency Large-Signal Excitation
IEEE Open Journal of Power Electronics
Multilayer ceramic capacitor
MLCC
loss modeling
Steinmetz Equation
iGSE
iGSE-C
title iGSE-C<sub>D</sub>&#x2014;An Electric-/Displacement-Field Related Steinmetz Model for Class II Multilayer Ceramic Capacitors Under Low-Frequency Large-Signal Excitation
title_full iGSE-C<sub>D</sub>&#x2014;An Electric-/Displacement-Field Related Steinmetz Model for Class II Multilayer Ceramic Capacitors Under Low-Frequency Large-Signal Excitation
title_fullStr iGSE-C<sub>D</sub>&#x2014;An Electric-/Displacement-Field Related Steinmetz Model for Class II Multilayer Ceramic Capacitors Under Low-Frequency Large-Signal Excitation
title_full_unstemmed iGSE-C<sub>D</sub>&#x2014;An Electric-/Displacement-Field Related Steinmetz Model for Class II Multilayer Ceramic Capacitors Under Low-Frequency Large-Signal Excitation
title_short iGSE-C<sub>D</sub>&#x2014;An Electric-/Displacement-Field Related Steinmetz Model for Class II Multilayer Ceramic Capacitors Under Low-Frequency Large-Signal Excitation
title_sort igse c sub d sub x2014 an electric displacement field related steinmetz model for class ii multilayer ceramic capacitors under low frequency large signal excitation
topic Multilayer ceramic capacitor
MLCC
loss modeling
Steinmetz Equation
iGSE
iGSE-C
url https://ieeexplore.ieee.org/document/10032790/
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