iGSE-C<sub>D</sub>—An Electric-/Displacement-Field Related Steinmetz Model for Class II Multilayer Ceramic Capacitors Under Low-Frequency Large-Signal Excitation
Multilayer Ceramic Capacitors (MLCCs) are of paramount importance in electronics and ferroelectric Class II dielectrics enable outstanding energy-density values. However, the non-linear dielectric constant and associated low-frequency large-signal excitation losses of Class II MLCCs may cause critic...
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IEEE
2023-01-01
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Series: | IEEE Open Journal of Power Electronics |
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Online Access: | https://ieeexplore.ieee.org/document/10032790/ |
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author | David Menzi Morris Heller George Kerridge Peter Marley Angela Ellmore Shmuel Ben-Yaakov Johann W. Kolar |
author_facet | David Menzi Morris Heller George Kerridge Peter Marley Angela Ellmore Shmuel Ben-Yaakov Johann W. Kolar |
author_sort | David Menzi |
collection | DOAJ |
description | Multilayer Ceramic Capacitors (MLCCs) are of paramount importance in electronics and ferroelectric Class II dielectrics enable outstanding energy-density values. However, the non-linear dielectric constant and associated low-frequency large-signal excitation losses of Class II MLCCs may cause critical overheating. A peak-charge based Steinmetz loss model entitled iGSE-C<sub>Q</sub> is known in literature and allows to accurately calculate MLCC low-frequency large-signal excitation losses under various operating conditions including biased and non-sinusoidal excitation voltage waveforms. Such a macroscopic iGSE-C<sub>Q</sub> model, however, is inherently limited to a specific MLCC, and in contrast to Steinmetz loss modeling for ferromagnetic inductor cores, the losses of other devices employing the same dielectric material cannot be predicted. Recent literature therefore proposed a microscopic and/or material specific MLCC Steinmetz Model entitled iGSE-C<sub>D</sub> which allows to calculate the losses of any MLCC of the same dielectric material based upon just a single set of Steinmetz parameters. However, due to the lack of information on the internal device geometry, the iGSE-C<sub>D</sub> could be verified only indirectly so far by means of a loss normalization based on the device capacitance and rated voltage. In this paper, we demonstrate the feasibility of a microscopic iGSE-C<sub>D</sub> MLCC loss model enabled by manufacturer data on the internal capacitor structure. The iGSE-C<sub>D</sub> is verified for two different MLCC series employing a conventional X7R dielectric and a novel Hiteca (with reduced non-linearity) Class II dielectric material with loss estimation error below <inline-formula><tex-math notation="LaTeX">$22\%$</tex-math></inline-formula>. This error results due to component tolerances and is acceptable, especially when compared to the loss calculation based on the datasheet information which can be off by up to a factor of ten. The analysis of the Hiteca dielectric reveals a frequency behavior different to the X7R material, and is discussed in the Appendix of this paper. |
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spelling | doaj.art-e1a2a8c455444f3987e07b8ebe3ab1f52023-02-15T00:00:59ZengIEEEIEEE Open Journal of Power Electronics2644-13142023-01-01410711610.1109/OJPEL.2023.324083810032790iGSE-C<sub>D</sub>—An Electric-/Displacement-Field Related Steinmetz Model for Class II Multilayer Ceramic Capacitors Under Low-Frequency Large-Signal ExcitationDavid Menzi0https://orcid.org/0000-0002-9562-2157Morris Heller1https://orcid.org/0000-0002-5662-9241George Kerridge2https://orcid.org/0000-0002-1964-0572Peter Marley3Angela Ellmore4Shmuel Ben-Yaakov5https://orcid.org/0000-0003-1308-543XJohann W. Kolar6https://orcid.org/0000-0002-6000-7402Power Electronics Systems Laboratory, ETH Zurich, Zurich, SwitzerlandPower Electronics Systems Laboratory, ETH Zurich, Zurich, SwitzerlandKnowles Precision Devices, Norwich, U.K.Knowles Precision Devices, Norwich, U.K.Knowles Precision Devices, Norwich, U.K.Ben-Gurion University of the Negev, Beer-Sheva, IsraelPower Electronics Systems Laboratory, ETH Zurich, Zurich, SwitzerlandMultilayer Ceramic Capacitors (MLCCs) are of paramount importance in electronics and ferroelectric Class II dielectrics enable outstanding energy-density values. However, the non-linear dielectric constant and associated low-frequency large-signal excitation losses of Class II MLCCs may cause critical overheating. A peak-charge based Steinmetz loss model entitled iGSE-C<sub>Q</sub> is known in literature and allows to accurately calculate MLCC low-frequency large-signal excitation losses under various operating conditions including biased and non-sinusoidal excitation voltage waveforms. Such a macroscopic iGSE-C<sub>Q</sub> model, however, is inherently limited to a specific MLCC, and in contrast to Steinmetz loss modeling for ferromagnetic inductor cores, the losses of other devices employing the same dielectric material cannot be predicted. Recent literature therefore proposed a microscopic and/or material specific MLCC Steinmetz Model entitled iGSE-C<sub>D</sub> which allows to calculate the losses of any MLCC of the same dielectric material based upon just a single set of Steinmetz parameters. However, due to the lack of information on the internal device geometry, the iGSE-C<sub>D</sub> could be verified only indirectly so far by means of a loss normalization based on the device capacitance and rated voltage. In this paper, we demonstrate the feasibility of a microscopic iGSE-C<sub>D</sub> MLCC loss model enabled by manufacturer data on the internal capacitor structure. The iGSE-C<sub>D</sub> is verified for two different MLCC series employing a conventional X7R dielectric and a novel Hiteca (with reduced non-linearity) Class II dielectric material with loss estimation error below <inline-formula><tex-math notation="LaTeX">$22\%$</tex-math></inline-formula>. This error results due to component tolerances and is acceptable, especially when compared to the loss calculation based on the datasheet information which can be off by up to a factor of ten. The analysis of the Hiteca dielectric reveals a frequency behavior different to the X7R material, and is discussed in the Appendix of this paper.https://ieeexplore.ieee.org/document/10032790/Multilayer ceramic capacitorMLCCloss modelingSteinmetz EquationiGSEiGSE-C |
spellingShingle | David Menzi Morris Heller George Kerridge Peter Marley Angela Ellmore Shmuel Ben-Yaakov Johann W. Kolar iGSE-C<sub>D</sub>—An Electric-/Displacement-Field Related Steinmetz Model for Class II Multilayer Ceramic Capacitors Under Low-Frequency Large-Signal Excitation IEEE Open Journal of Power Electronics Multilayer ceramic capacitor MLCC loss modeling Steinmetz Equation iGSE iGSE-C |
title | iGSE-C<sub>D</sub>—An Electric-/Displacement-Field Related Steinmetz Model for Class II Multilayer Ceramic Capacitors Under Low-Frequency Large-Signal Excitation |
title_full | iGSE-C<sub>D</sub>—An Electric-/Displacement-Field Related Steinmetz Model for Class II Multilayer Ceramic Capacitors Under Low-Frequency Large-Signal Excitation |
title_fullStr | iGSE-C<sub>D</sub>—An Electric-/Displacement-Field Related Steinmetz Model for Class II Multilayer Ceramic Capacitors Under Low-Frequency Large-Signal Excitation |
title_full_unstemmed | iGSE-C<sub>D</sub>—An Electric-/Displacement-Field Related Steinmetz Model for Class II Multilayer Ceramic Capacitors Under Low-Frequency Large-Signal Excitation |
title_short | iGSE-C<sub>D</sub>—An Electric-/Displacement-Field Related Steinmetz Model for Class II Multilayer Ceramic Capacitors Under Low-Frequency Large-Signal Excitation |
title_sort | igse c sub d sub x2014 an electric displacement field related steinmetz model for class ii multilayer ceramic capacitors under low frequency large signal excitation |
topic | Multilayer ceramic capacitor MLCC loss modeling Steinmetz Equation iGSE iGSE-C |
url | https://ieeexplore.ieee.org/document/10032790/ |
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