Experimentally investigating the performance degradations of the CMOS PA at different temperatures
To investigate the temperature dependency of the specifications for Power Amplifiers (PAs), the performance degradations of an IC PA under different temperature conditions are investigated experimentally. The experimental results show that the performance degradations of the PA are sensitive to temp...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2021-11-01
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| Series: | AIP Advances |
| Online Access: | http://dx.doi.org/10.1063/5.0071801 |
| _version_ | 1818682512944136192 |
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| author | Zhao He Shaohua Zhou Meining Nie |
| author_facet | Zhao He Shaohua Zhou Meining Nie |
| author_sort | Zhao He |
| collection | DOAJ |
| description | To investigate the temperature dependency of the specifications for Power Amplifiers (PAs), the performance degradations of an IC PA under different temperature conditions are investigated experimentally. The experimental results show that the performance degradations of the PA are sensitive to temperature changes. The main reasons for these degradations are discussed and analyzed in this paper. The research performed in the study provides another angle to handle the practical working environments rather than the extreme cases as the reliability study. |
| first_indexed | 2024-12-17T10:20:02Z |
| format | Article |
| id | doaj.art-e350eaaeffa64f5dae1021cc5a49782e |
| institution | Directory Open Access Journal |
| issn | 2158-3226 |
| language | English |
| last_indexed | 2024-12-17T10:20:02Z |
| publishDate | 2021-11-01 |
| publisher | AIP Publishing LLC |
| record_format | Article |
| series | AIP Advances |
| spelling | doaj.art-e350eaaeffa64f5dae1021cc5a49782e2022-12-21T21:52:49ZengAIP Publishing LLCAIP Advances2158-32262021-11-011111115205115205-710.1063/5.0071801Experimentally investigating the performance degradations of the CMOS PA at different temperaturesZhao He0Shaohua Zhou1Meining Nie2National Institute of Metrology, Beijing 100029, ChinaSchool of Microelectronics, Tianjin University, Tianjin 300072, ChinaNational Institute of Metrology, Beijing 100029, ChinaTo investigate the temperature dependency of the specifications for Power Amplifiers (PAs), the performance degradations of an IC PA under different temperature conditions are investigated experimentally. The experimental results show that the performance degradations of the PA are sensitive to temperature changes. The main reasons for these degradations are discussed and analyzed in this paper. The research performed in the study provides another angle to handle the practical working environments rather than the extreme cases as the reliability study.http://dx.doi.org/10.1063/5.0071801 |
| spellingShingle | Zhao He Shaohua Zhou Meining Nie Experimentally investigating the performance degradations of the CMOS PA at different temperatures AIP Advances |
| title | Experimentally investigating the performance degradations of the CMOS PA at different temperatures |
| title_full | Experimentally investigating the performance degradations of the CMOS PA at different temperatures |
| title_fullStr | Experimentally investigating the performance degradations of the CMOS PA at different temperatures |
| title_full_unstemmed | Experimentally investigating the performance degradations of the CMOS PA at different temperatures |
| title_short | Experimentally investigating the performance degradations of the CMOS PA at different temperatures |
| title_sort | experimentally investigating the performance degradations of the cmos pa at different temperatures |
| url | http://dx.doi.org/10.1063/5.0071801 |
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