Experimentally investigating the performance degradations of the CMOS PA at different temperatures

Experimentally investigating the performance degradations of the CMOS PA at different temperatures

To investigate the temperature dependency of the specifications for Power Amplifiers (PAs), the performance degradations of an IC PA under different temperature conditions are investigated experimentally. The experimental results show that the performance degradations of the PA are sensitive to temp...

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Bibliographic Details
Main Authors:	Zhao He, Shaohua Zhou, Meining Nie
Format:	Article
Language:	English
Published:	AIP Publishing LLC 2021-11-01
Series:	AIP Advances
Online Access:	http://dx.doi.org/10.1063/5.0071801

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