Local work function and STM tip-induced distortion of graphene on Ir(111)
The contact conductance and the apparent barrier height ϕ of graphene on Ir(111) are measured with a cryogenic scanning tunneling microscope. A strong dependence of ϕ on the tip–sample distance is found and explained by a local lifting of the graphene film by van-der-Waals forces. Variations of ϕ ob...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
IOP Publishing
2014-01-01
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| Series: | New Journal of Physics |
| Subjects: | |
| Online Access: | https://doi.org/10.1088/1367-2630/16/5/053036 |