Jeon, C., Kim, M., Kim, J., Yang, S., Choi, E., & Lim, B. (2025). Systematic Analysis of Driving Modes and NiFe Layer Thickness in Planar Hall Magnetoresistance Sensors. MDPI AG.
Chicago Style (17th ed.) CitationJeon, Changyeop, Mijin Kim, Jinwoo Kim, Sunghee Yang, Eunseo Choi, and Byeonghwa Lim. Systematic Analysis of Driving Modes and NiFe Layer Thickness in Planar Hall Magnetoresistance Sensors. MDPI AG, 2025.
MLA (9th ed.) CitationJeon, Changyeop, et al. Systematic Analysis of Driving Modes and NiFe Layer Thickness in Planar Hall Magnetoresistance Sensors. MDPI AG, 2025.
Warning: These citations may not always be 100% accurate.