Silicon-carbide (SiC) nanocrystal as technology and characterization and its applications in photo-stabilizers of Teflon
Polytetrafluoroethylene (PTFE) was mixed with silicon carbide nanoparticles in various quantities to create thin films. Long-term UV light exposure to the PTFE films was used to study the effects of SiC NPs as a photo-stabilizer by assessing changes in weight loss and surface shape. Comparing PTFE f...
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| Format: | Article |
| Language: | English |
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KeAi Communications Co., Ltd.
2023-01-01
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| Series: | Materials Science for Energy Technologies |
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| Online Access: | http://www.sciencedirect.com/science/article/pii/S2589299122000660 |
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| author | Raghda Alsayed Dina S. Ahmed Amani Husain Mohammed Al-Baidhani Mohammed Al-Mashhadani Alaa A. Rashad Muna Bufaroosha Emad Yousif |
| author_facet | Raghda Alsayed Dina S. Ahmed Amani Husain Mohammed Al-Baidhani Mohammed Al-Mashhadani Alaa A. Rashad Muna Bufaroosha Emad Yousif |
| author_sort | Raghda Alsayed |
| collection | DOAJ |
| description | Polytetrafluoroethylene (PTFE) was mixed with silicon carbide nanoparticles in various quantities to create thin films. Long-term UV light exposure to the PTFE films was used to study the effects of SiC NPs as a photo-stabilizer by assessing changes in weight loss and surface shape. Comparing PTFE films with various SiC NP concentrations to the blank film, very little variation was seen. AFM and optical microscopy were also used to analyze the surface morphology of films. When PTFE films with additives were compared to blank film, there were hard to observe any negative changes brought due to photo-degradation. Additionally, the surfaces appeared more uniformly smooth hence SiC NPs work well as photo-stabilizers to impede photo-degradation, particularly 0.0005 gm weight. Silicon carbide nanoparticles absorb ultraviolet light, bind polymeric chains, scavenge radical moieties, and degrade peroxide residues. |
| first_indexed | 2024-04-11T00:56:01Z |
| format | Article |
| id | doaj.art-e441c1e2c4fe479fa654cd2e31453f93 |
| institution | Directory Open Access Journal |
| issn | 2589-2991 |
| language | English |
| last_indexed | 2024-04-11T00:56:01Z |
| publishDate | 2023-01-01 |
| publisher | KeAi Communications Co., Ltd. |
| record_format | Article |
| series | Materials Science for Energy Technologies |
| spelling | doaj.art-e441c1e2c4fe479fa654cd2e31453f932023-01-05T04:32:35ZengKeAi Communications Co., Ltd.Materials Science for Energy Technologies2589-29912023-01-016166177Silicon-carbide (SiC) nanocrystal as technology and characterization and its applications in photo-stabilizers of TeflonRaghda Alsayed0Dina S. Ahmed1Amani Husain2Mohammed Al-Baidhani3Mohammed Al-Mashhadani4Alaa A. Rashad5Muna Bufaroosha6Emad Yousif7Department of Chemistry, College of Science, Al-Nahrain University, 64021 Baghdad, IraqDepartment of Medical Instrumentation Engineering, Al-Mansour University College, Baghdad 64201, IraqPolymer Research Unit, College of Science, Al-Mustansiriyah University, 10052 Baghdad, IraqDepartment of Physics, College of Science, Al-Nahrain University, 64021 Baghdad, IraqDepartment of Chemistry, College of Science, Al-Nahrain University, 64021 Baghdad, IraqDepartment of Chemistry, College of Science, Al-Nahrain University, 64021 Baghdad, IraqDepartment of Chemistry, College of Science, UAE University, 15551 Al-Ain, UAE; Corresponding author.Department of Chemistry, College of Science, Al-Nahrain University, 64021 Baghdad, IraqPolytetrafluoroethylene (PTFE) was mixed with silicon carbide nanoparticles in various quantities to create thin films. Long-term UV light exposure to the PTFE films was used to study the effects of SiC NPs as a photo-stabilizer by assessing changes in weight loss and surface shape. Comparing PTFE films with various SiC NP concentrations to the blank film, very little variation was seen. AFM and optical microscopy were also used to analyze the surface morphology of films. When PTFE films with additives were compared to blank film, there were hard to observe any negative changes brought due to photo-degradation. Additionally, the surfaces appeared more uniformly smooth hence SiC NPs work well as photo-stabilizers to impede photo-degradation, particularly 0.0005 gm weight. Silicon carbide nanoparticles absorb ultraviolet light, bind polymeric chains, scavenge radical moieties, and degrade peroxide residues.http://www.sciencedirect.com/science/article/pii/S2589299122000660Polytetrafluoroethylene (PTFE)UV radiationSiC NPsThin filmsPhoto-degradation |
| spellingShingle | Raghda Alsayed Dina S. Ahmed Amani Husain Mohammed Al-Baidhani Mohammed Al-Mashhadani Alaa A. Rashad Muna Bufaroosha Emad Yousif Silicon-carbide (SiC) nanocrystal as technology and characterization and its applications in photo-stabilizers of Teflon Materials Science for Energy Technologies Polytetrafluoroethylene (PTFE) UV radiation SiC NPs Thin films Photo-degradation |
| title | Silicon-carbide (SiC) nanocrystal as technology and characterization and its applications in photo-stabilizers of Teflon |
| title_full | Silicon-carbide (SiC) nanocrystal as technology and characterization and its applications in photo-stabilizers of Teflon |
| title_fullStr | Silicon-carbide (SiC) nanocrystal as technology and characterization and its applications in photo-stabilizers of Teflon |
| title_full_unstemmed | Silicon-carbide (SiC) nanocrystal as technology and characterization and its applications in photo-stabilizers of Teflon |
| title_short | Silicon-carbide (SiC) nanocrystal as technology and characterization and its applications in photo-stabilizers of Teflon |
| title_sort | silicon carbide sic nanocrystal as technology and characterization and its applications in photo stabilizers of teflon |
| topic | Polytetrafluoroethylene (PTFE) UV radiation SiC NPs Thin films Photo-degradation |
| url | http://www.sciencedirect.com/science/article/pii/S2589299122000660 |
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