New Features in Crystal Orientation and Phase Mapping for Transmission Electron Microscopy
ACOM/TEM is an automated electron diffraction pattern indexing tool that enables the structure, phase and crystallographic orientation of materials to be routinely determined. The software package, which is part of ACOM/TEM, has substantially evolved over the last fifteen years and has pioneered num...
| Main Authors: | , , , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2021-09-01
|
| Series: | Symmetry |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2073-8994/13/9/1675 |
| _version_ | 1797517167136079872 |
|---|---|
| author | Edgar F. Rauch Patrick Harrison Xuyang Zhou Michael Herbig Wolfgang Ludwig Muriel Véron |
| author_facet | Edgar F. Rauch Patrick Harrison Xuyang Zhou Michael Herbig Wolfgang Ludwig Muriel Véron |
| author_sort | Edgar F. Rauch |
| collection | DOAJ |
| description | ACOM/TEM is an automated electron diffraction pattern indexing tool that enables the structure, phase and crystallographic orientation of materials to be routinely determined. The software package, which is part of ACOM/TEM, has substantially evolved over the last fifteen years and has pioneered numerous additional functions with the constant objective of improving its capabilities to make the tremendous amount of information contained in the diffraction patterns easily available to the user. Initially devoted to the analysis of local crystallographic texture, and as an alternative to both X-ray pole figure measurement and EBSD accessories for scanning electron microscopes, it has rapidly proven itself effective to distinguish multiple different phases contained within a given sample, including amorphous phases. Different strategies were developed to bypass the inherent limitations of transmission electron diffraction patterns, such as 180° ambiguities or the complexity of patterns produced from overlapping grains. Post processing algorithms have also been developed to improve the angular resolution and to increase the computing rate. The present paper aims to review some of these facilities. On-going works on 3D reconstruction are also introduced. |
| first_indexed | 2024-03-10T07:11:02Z |
| format | Article |
| id | doaj.art-e49f92923ad74313985f5918a106faf7 |
| institution | Directory Open Access Journal |
| issn | 2073-8994 |
| language | English |
| last_indexed | 2024-03-10T07:11:02Z |
| publishDate | 2021-09-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Symmetry |
| spelling | doaj.art-e49f92923ad74313985f5918a106faf72023-11-22T15:28:20ZengMDPI AGSymmetry2073-89942021-09-01139167510.3390/sym13091675New Features in Crystal Orientation and Phase Mapping for Transmission Electron MicroscopyEdgar F. Rauch0Patrick Harrison1Xuyang Zhou2Michael Herbig3Wolfgang Ludwig4Muriel Véron5SIMAP, Grenoble INP, Université Grenoble Alpes, CNRS, 38000 Grenoble, FranceSIMAP, Grenoble INP, Université Grenoble Alpes, CNRS, 38000 Grenoble, FranceMax-Planck-Institut für Eisenforschung GmbH, Max-Planck-Str. 1, 40237 Düsseldorf, GermanyMax-Planck-Institut für Eisenforschung GmbH, Max-Planck-Str. 1, 40237 Düsseldorf, GermanyMATEIS, INSA Lyon, Université Lyon I, CNRS UMR 5510, 69621 Villeurbanne, FranceSIMAP, Grenoble INP, Université Grenoble Alpes, CNRS, 38000 Grenoble, FranceACOM/TEM is an automated electron diffraction pattern indexing tool that enables the structure, phase and crystallographic orientation of materials to be routinely determined. The software package, which is part of ACOM/TEM, has substantially evolved over the last fifteen years and has pioneered numerous additional functions with the constant objective of improving its capabilities to make the tremendous amount of information contained in the diffraction patterns easily available to the user. Initially devoted to the analysis of local crystallographic texture, and as an alternative to both X-ray pole figure measurement and EBSD accessories for scanning electron microscopes, it has rapidly proven itself effective to distinguish multiple different phases contained within a given sample, including amorphous phases. Different strategies were developed to bypass the inherent limitations of transmission electron diffraction patterns, such as 180° ambiguities or the complexity of patterns produced from overlapping grains. Post processing algorithms have also been developed to improve the angular resolution and to increase the computing rate. The present paper aims to review some of these facilities. On-going works on 3D reconstruction are also introduced.https://www.mdpi.com/2073-8994/13/9/1675ACOM/TEMASTARtransmission electron microscopyscanning precession electron diffraction (SPED)phase mappingelectron crystallography |
| spellingShingle | Edgar F. Rauch Patrick Harrison Xuyang Zhou Michael Herbig Wolfgang Ludwig Muriel Véron New Features in Crystal Orientation and Phase Mapping for Transmission Electron Microscopy Symmetry ACOM/TEM ASTAR transmission electron microscopy scanning precession electron diffraction (SPED) phase mapping electron crystallography |
| title | New Features in Crystal Orientation and Phase Mapping for Transmission Electron Microscopy |
| title_full | New Features in Crystal Orientation and Phase Mapping for Transmission Electron Microscopy |
| title_fullStr | New Features in Crystal Orientation and Phase Mapping for Transmission Electron Microscopy |
| title_full_unstemmed | New Features in Crystal Orientation and Phase Mapping for Transmission Electron Microscopy |
| title_short | New Features in Crystal Orientation and Phase Mapping for Transmission Electron Microscopy |
| title_sort | new features in crystal orientation and phase mapping for transmission electron microscopy |
| topic | ACOM/TEM ASTAR transmission electron microscopy scanning precession electron diffraction (SPED) phase mapping electron crystallography |
| url | https://www.mdpi.com/2073-8994/13/9/1675 |
| work_keys_str_mv | AT edgarfrauch newfeaturesincrystalorientationandphasemappingfortransmissionelectronmicroscopy AT patrickharrison newfeaturesincrystalorientationandphasemappingfortransmissionelectronmicroscopy AT xuyangzhou newfeaturesincrystalorientationandphasemappingfortransmissionelectronmicroscopy AT michaelherbig newfeaturesincrystalorientationandphasemappingfortransmissionelectronmicroscopy AT wolfgangludwig newfeaturesincrystalorientationandphasemappingfortransmissionelectronmicroscopy AT murielveron newfeaturesincrystalorientationandphasemappingfortransmissionelectronmicroscopy |