| Summary: | In the presented work, the tellurite glasses TeO<sub>2</sub>-WO<sub>3</sub>-ZnO doped with Tm<sup>3+</sup> and Ho<sup>3+</sup> ions were prepared by the same glass forming method. X-ray diffraction (XRD) and differential thermal analysis (DTA) techniques were used to study the effects of the forming technology on the thermal and structural properties of the fabricated glasses. After controlled crystallization of investigated glasses, the emission in the VIS- and NIR range was determined. The effect of silver doping on emission intensity was investigated. The value of the activation energy of the glass crystallization process was determined, while the E<sub>a</sub> value for pure TeO<sub>2</sub> glass was much lower than for tellurite glasses TeO<sub>2</sub>-WO<sub>3</sub>-ZnO.
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