<italic toggle="yes">In Situ</italic> Imaging of <named-content content-type="genus-species">Candida albicans</named-content> Hyphal Growth via Atomic Force Microscopy

<italic toggle="yes">In Situ</italic> Imaging of <named-content content-type="genus-species">Candida albicans</named-content> Hyphal Growth via Atomic Force Microscopy

ABSTRACT Candida albicans is an opportunistic fungal pathogen of humans known for its ability to cause a wide range of infections. One major virulence factor of C. albicans is its ability to form hyphae that can invade host tissues and cause disseminated infections. Here, we introduce a method based...

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Bibliographic Details
Main Authors: Arzu Çolak, Mélanie A. C. Ikeh, Clarissa J. Nobile, Mehmet Z. Baykara
Format: Article
Language:English
Published: American Society for Microbiology 2020-12-01
Series:mSphere
Subjects:
Candida albicans
atomic force microscopy
hyphal development
Online Access:https://journals.asm.org/doi/10.1128/mSphere.00946-20

Internet

https://journals.asm.org/doi/10.1128/mSphere.00946-20

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