Prediction of Single-Event Effects in FDSOI Devices Based on Deep Learning

Prediction of Single-Event Effects in FDSOI Devices Based on Deep Learning

Single-event effects (SEE) are an important index of radiation resistance for fully depleted silicon on insulator (FDSOI) devices. The research into traditional FDSOI devices is based on simulation software, which is time consuming, requires a large amount of calculation, and has complex operations....

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Bibliographic Details
Main Authors: Rong Zhao, Shulong Wang, Shougang Du, Jinbin Pan, Lan Ma, Shupeng Chen, Hongxia Liu, Yilei Chen
Format: Article
Language:English
Published: MDPI AG 2023-02-01
Series:Micromachines
Subjects:
deep neural network (DNN)
FDSOI devices
single-event effect (SEE)
drain transient current pulse
Online Access:https://www.mdpi.com/2072-666X/14/3/502

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