Structure determination using high-order spatial correlations in single-particle X-ray scattering

Single-particle imaging using X-ray free-electron lasers (XFELs) is a promising technique for observing nanoscale biological samples under near-physiological conditions. However, as the sample's orientation in each diffraction pattern is unknown, advanced algorithms are required to reconstruct...

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Main Authors: Wenyang Zhao, Osamu Miyashita, Miki Nakano, Florence Tama
Format: Article
Language:English
Published: International Union of Crystallography 2024-01-01
Series:IUCrJ
Subjects:
Online Access:http://scripts.iucr.org/cgi-bin/paper?S2052252523009831
_version_ 1797360692362215424
author Wenyang Zhao
Osamu Miyashita
Miki Nakano
Florence Tama
author_facet Wenyang Zhao
Osamu Miyashita
Miki Nakano
Florence Tama
author_sort Wenyang Zhao
collection DOAJ
description Single-particle imaging using X-ray free-electron lasers (XFELs) is a promising technique for observing nanoscale biological samples under near-physiological conditions. However, as the sample's orientation in each diffraction pattern is unknown, advanced algorithms are required to reconstruct the 3D diffraction intensity volume and subsequently the sample's density model. While most approaches perform 3D reconstruction via determining the orientation of each diffraction pattern, a correlation-based approach utilizes the averaged spatial correlations of diffraction intensities over all patterns, making it well suited for processing experimental data with a poor signal-to-noise ratio of individual patterns. Here, a method is proposed to determine the 3D structure of a sample by analyzing the double, triple and quadruple spatial correlations in diffraction patterns. This ab initio method can reconstruct the basic shape of an irregular unsymmetric 3D sample without requiring any prior knowledge of the sample. The impact of background and noise on correlations is investigated and corrected to ensure the success of reconstruction under simulated experimental conditions. Additionally, the feasibility of using the correlation-based approach to process incomplete partial diffraction patterns is demonstrated. The proposed method is a variable addition to existing algorithms for 3D reconstruction and will further promote the development and adoption of XFEL single-particle imaging techniques.
first_indexed 2024-03-08T15:42:11Z
format Article
id doaj.art-e5fe81cc97df4c28b7cd20f100d36a5b
institution Directory Open Access Journal
issn 2052-2525
language English
last_indexed 2024-03-08T15:42:11Z
publishDate 2024-01-01
publisher International Union of Crystallography
record_format Article
series IUCrJ
spelling doaj.art-e5fe81cc97df4c28b7cd20f100d36a5b2024-01-09T14:58:15ZengInternational Union of CrystallographyIUCrJ2052-25252024-01-011119210810.1107/S2052252523009831zf5022Structure determination using high-order spatial correlations in single-particle X-ray scatteringWenyang Zhao0Osamu Miyashita1Miki Nakano2Florence Tama3Computational Structural Biology Research Team, RIKEN Center for Computational Science, 6-7-1 Minatojima-minamimachi, Chuo-ku, Kobe, Hyogo 650-0047, JapanComputational Structural Biology Research Team, RIKEN Center for Computational Science, 6-7-1 Minatojima-minamimachi, Chuo-ku, Kobe, Hyogo 650-0047, JapanComputational Structural Biology Research Team, RIKEN Center for Computational Science, 6-7-1 Minatojima-minamimachi, Chuo-ku, Kobe, Hyogo 650-0047, JapanComputational Structural Biology Research Team, RIKEN Center for Computational Science, 6-7-1 Minatojima-minamimachi, Chuo-ku, Kobe, Hyogo 650-0047, JapanSingle-particle imaging using X-ray free-electron lasers (XFELs) is a promising technique for observing nanoscale biological samples under near-physiological conditions. However, as the sample's orientation in each diffraction pattern is unknown, advanced algorithms are required to reconstruct the 3D diffraction intensity volume and subsequently the sample's density model. While most approaches perform 3D reconstruction via determining the orientation of each diffraction pattern, a correlation-based approach utilizes the averaged spatial correlations of diffraction intensities over all patterns, making it well suited for processing experimental data with a poor signal-to-noise ratio of individual patterns. Here, a method is proposed to determine the 3D structure of a sample by analyzing the double, triple and quadruple spatial correlations in diffraction patterns. This ab initio method can reconstruct the basic shape of an irregular unsymmetric 3D sample without requiring any prior knowledge of the sample. The impact of background and noise on correlations is investigated and corrected to ensure the success of reconstruction under simulated experimental conditions. Additionally, the feasibility of using the correlation-based approach to process incomplete partial diffraction patterns is demonstrated. The proposed method is a variable addition to existing algorithms for 3D reconstruction and will further promote the development and adoption of XFEL single-particle imaging techniques.http://scripts.iucr.org/cgi-bin/paper?S20522525230098313d reconstructionssingle-particle imagingx-ray free-electron lasersspatial correlationsstructure determinationsingle-particle x-ray scatteringdiffraction patternsdetector noise
spellingShingle Wenyang Zhao
Osamu Miyashita
Miki Nakano
Florence Tama
Structure determination using high-order spatial correlations in single-particle X-ray scattering
IUCrJ
3d reconstructions
single-particle imaging
x-ray free-electron lasers
spatial correlations
structure determination
single-particle x-ray scattering
diffraction patterns
detector noise
title Structure determination using high-order spatial correlations in single-particle X-ray scattering
title_full Structure determination using high-order spatial correlations in single-particle X-ray scattering
title_fullStr Structure determination using high-order spatial correlations in single-particle X-ray scattering
title_full_unstemmed Structure determination using high-order spatial correlations in single-particle X-ray scattering
title_short Structure determination using high-order spatial correlations in single-particle X-ray scattering
title_sort structure determination using high order spatial correlations in single particle x ray scattering
topic 3d reconstructions
single-particle imaging
x-ray free-electron lasers
spatial correlations
structure determination
single-particle x-ray scattering
diffraction patterns
detector noise
url http://scripts.iucr.org/cgi-bin/paper?S2052252523009831
work_keys_str_mv AT wenyangzhao structuredeterminationusinghighorderspatialcorrelationsinsingleparticlexrayscattering
AT osamumiyashita structuredeterminationusinghighorderspatialcorrelationsinsingleparticlexrayscattering
AT mikinakano structuredeterminationusinghighorderspatialcorrelationsinsingleparticlexrayscattering
AT florencetama structuredeterminationusinghighorderspatialcorrelationsinsingleparticlexrayscattering