Structure determination using high-order spatial correlations in single-particle X-ray scattering

Structure determination using high-order spatial correlations in single-particle X-ray scattering

Single-particle imaging using X-ray free-electron lasers (XFELs) is a promising technique for observing nanoscale biological samples under near-physiological conditions. However, as the sample's orientation in each diffraction pattern is unknown, advanced algorithms are required to reconstruct...

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Bibliographic Details
Main Authors: Wenyang Zhao, Osamu Miyashita, Miki Nakano, Florence Tama
Format: Article
Language:English
Published: International Union of Crystallography 2024-01-01
Series:IUCrJ
Subjects:
3d reconstructions
single-particle imaging
x-ray free-electron lasers
spatial correlations
structure determination
single-particle x-ray scattering
diffraction patterns
detector noise
Online Access:http://scripts.iucr.org/cgi-bin/paper?S2052252523009831

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