Electric Properties of Organic-on-Inorganic n-Si/VOPc Heterojunction

In the current study vanadyl-phthalocyanine (VOPc) thin films were deposited by vacuum evaporation on n-Si substrate resulting in an organic-on-inorganic (n-Si/VOPc) heterojunctions. Ag films were deposited as electrodes. Thicknesses of the VOPc films were in the range of 100-300 nm. The dark I-V ch...

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Bibliographic Details
Main Authors: Kh. S. Karimov, B. F. Irgaziev, M. Mahroof-Tahir, I. Qazi, I. Murtaza, Z. M. Karieva, H. B. Senin
Format: Article
Language:English
Published: al-Farabi Kazakh National University 2009-04-01
Series:Eurasian Chemico-Technological Journal
Online Access:http://ect-journal.kz/index.php/ectj/article/view/519
Description
Summary:In the current study vanadyl-phthalocyanine (VOPc) thin films were deposited by vacuum evaporation on n-Si substrate resulting in an organic-on-inorganic (n-Si/VOPc) heterojunctions. Ag films were deposited as electrodes. Thicknesses of the VOPc films were in the range of 100-300 nm. The dark I-V characteristics exhibited rectification behavior. The rectification ratio (RR) decreased from 4 to 0.4 as the thickness of the VOPc film decreased. The dark I-V characteristics were simulated by modified Schokley equation and spaace-charge limited currents (SCLC) approach. Investigations were carried out to study the effect of VOPc films thickness on reverse saturation current , diode quality factor and mobility of charge carriers.
ISSN:1562-3920
2522-4867