Dynamics of native oxide growth on CdTe and CdZnTe X-ray and gamma-ray detectors

Dynamics of native oxide growth on CdTe and CdZnTe X-ray and gamma-ray detectors

We studied the growth of the surface oxide layer on four different CdTe and CdZnTe X-ray and gamma-ray detector-grade samples using spectroscopic ellipsometry. We observed gradual oxidization of CdTe and CdZnTe after chemical etching in bromine solutions. From X-ray photoelectron spectroscopy measur...

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Bibliographic Details
Main Authors: Jakub Zázvorka, Jan Franc, Lukáš Beran, Pavel Moravec, Jakub Pekárek, Martin Veis
Format: Article
Language:English
Published: Taylor & Francis Group 2016-01-01
Series:Science and Technology of Advanced Materials
Subjects:
cdte
oxidation
ellipsometry
xps
leakage current
Online Access:http://dx.doi.org/10.1080/14686996.2016.1250105

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