Influence of the content of stacked ZnO on the structural and optical properties of heterostructured ZnO/Ga2O3 films

The rising demand for heterojunction materials stimulated by the great achievements of modern nanotechnology has triggered enormous interests in the investigation of their materials properties. Heterostructured ZnO/Ga2O3 has been deployed for different device applications, but its several optical pa...

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Main Authors: Peverga R. Jubu, E. Danladi, M.B. Ochang, O. Adedokun, C.C. Amadi, D.D. Hile, W.V. Zhiya, A.A. Iorokpen, Y. Yusof, F.K. Yam
Format: Article
Language:English
Published: Elsevier 2024-02-01
Series:Optical Materials: X
Subjects:
Online Access:http://www.sciencedirect.com/science/article/pii/S2590147824000032
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author Peverga R. Jubu
E. Danladi
M.B. Ochang
O. Adedokun
C.C. Amadi
D.D. Hile
W.V. Zhiya
A.A. Iorokpen
Y. Yusof
F.K. Yam
author_facet Peverga R. Jubu
E. Danladi
M.B. Ochang
O. Adedokun
C.C. Amadi
D.D. Hile
W.V. Zhiya
A.A. Iorokpen
Y. Yusof
F.K. Yam
author_sort Peverga R. Jubu
collection DOAJ
description The rising demand for heterojunction materials stimulated by the great achievements of modern nanotechnology has triggered enormous interests in the investigation of their materials properties. Heterostructured ZnO/Ga2O3 has been deployed for different device applications, but its several optical parameters have rarely been investigated. The present work attempts to investigate the influence of the thickness of stacked ZnO layer on the surface of Ga2O3 film. Optical parameters, such as absorption and extinction coefficient, Urbach energy, refractive index, dielectric constants, optical dispersion energy, single oscillator energy, static refractive index, oscillator strength, and oscillator wavelength of the ZnO/Ga2O3 films were studied. Morphological characterization showed microstructures of various shapes. Cross-section measurements showed that the thickness of the Ga2O3 layer remained approximately the same for all samples, while the thickness of the ZnO layer increased from 0 to 5.14 nm. Structural analysis revealed the coexistence of β-Ga2O3 and wurtzite ZnO crystal phases. UV–Vis absorption spectra demonstrated two distinct absorptions belonging to the β-Ga2O3 and ZnO. The bandgap of the composite ranged between 4.43 and 4.69 eV with an increase in the amount of ZnO at the surface. The absorption and extinction coefficient were in the order of 103 cm−1 and 10−5, respectively. The Urbach energy ranged between 0.688 and 1.125 eV. The refractive index was in the range 2.09–2.85, while the static refractive index ranged between 1.90 and 2.73. Also reported were other optical parameters, such as the real and imaginary dielectric constant, dispersive energy, single oscillator energy, oscillator strength, and oscillator wavelength.
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spelling doaj.art-e7869e223f5746b9b7a0e1e0c770caed2024-02-10T04:45:25ZengElsevierOptical Materials: X2590-14782024-02-0121100291Influence of the content of stacked ZnO on the structural and optical properties of heterostructured ZnO/Ga2O3 filmsPeverga R. Jubu0E. Danladi1M.B. Ochang2O. Adedokun3C.C. Amadi4D.D. Hile5W.V. Zhiya6A.A. Iorokpen7Y. Yusof8F.K. Yam9Nanophysics Laboratory, Department of Physics, Joseph Sarwuan Tarka University Makurdi (Federal University of Agriculture Makurdi) P.M.B. 2373, Makurdi, Benue State, Nigeria; School of Physics, Universiti Sains Malaysia (USM), 11800, Penang, Malaysia; Corresponding author. Nanophysics Laboratory, Department of Physics, Joseph Sarwuan Tarka University Makurdi (Federal University of Agriculture Makurdi) P.M.B. 2373, Makurdi, Benue State, Nigeria.Department of Physics, Federal University of Health Sciences Otukpo, Benue State, NigeriaNanophysics Laboratory, Department of Physics, Joseph Sarwuan Tarka University Makurdi (Federal University of Agriculture Makurdi) P.M.B. 2373, Makurdi, Benue State, NigeriaDepartment of Pure and Applied Physics, Ladoke Akintola University of Technology, Ogbomoso, Oyo State, NigeriaDepartment of Civil Engineering, Federal University of Technology Owerri, P.M.B. 1526, Owerri, Imo State, NigeriaNanophysics Laboratory, Department of Physics, Joseph Sarwuan Tarka University Makurdi (Federal University of Agriculture Makurdi) P.M.B. 2373, Makurdi, Benue State, NigeriaNanophysics Laboratory, Department of Physics, Joseph Sarwuan Tarka University Makurdi (Federal University of Agriculture Makurdi) P.M.B. 2373, Makurdi, Benue State, NigeriaNanophysics Laboratory, Department of Physics, Joseph Sarwuan Tarka University Makurdi (Federal University of Agriculture Makurdi) P.M.B. 2373, Makurdi, Benue State, NigeriaSchool of Physics, Universiti Sains Malaysia (USM), 11800, Penang, MalaysiaSchool of Physics, Universiti Sains Malaysia (USM), 11800, Penang, Malaysia; Corresponding author.The rising demand for heterojunction materials stimulated by the great achievements of modern nanotechnology has triggered enormous interests in the investigation of their materials properties. Heterostructured ZnO/Ga2O3 has been deployed for different device applications, but its several optical parameters have rarely been investigated. The present work attempts to investigate the influence of the thickness of stacked ZnO layer on the surface of Ga2O3 film. Optical parameters, such as absorption and extinction coefficient, Urbach energy, refractive index, dielectric constants, optical dispersion energy, single oscillator energy, static refractive index, oscillator strength, and oscillator wavelength of the ZnO/Ga2O3 films were studied. Morphological characterization showed microstructures of various shapes. Cross-section measurements showed that the thickness of the Ga2O3 layer remained approximately the same for all samples, while the thickness of the ZnO layer increased from 0 to 5.14 nm. Structural analysis revealed the coexistence of β-Ga2O3 and wurtzite ZnO crystal phases. UV–Vis absorption spectra demonstrated two distinct absorptions belonging to the β-Ga2O3 and ZnO. The bandgap of the composite ranged between 4.43 and 4.69 eV with an increase in the amount of ZnO at the surface. The absorption and extinction coefficient were in the order of 103 cm−1 and 10−5, respectively. The Urbach energy ranged between 0.688 and 1.125 eV. The refractive index was in the range 2.09–2.85, while the static refractive index ranged between 1.90 and 2.73. Also reported were other optical parameters, such as the real and imaginary dielectric constant, dispersive energy, single oscillator energy, oscillator strength, and oscillator wavelength.http://www.sciencedirect.com/science/article/pii/S2590147824000032ZnO/Ga2O3HeterojunctionHeterostructureSemiconductorOptical properties
spellingShingle Peverga R. Jubu
E. Danladi
M.B. Ochang
O. Adedokun
C.C. Amadi
D.D. Hile
W.V. Zhiya
A.A. Iorokpen
Y. Yusof
F.K. Yam
Influence of the content of stacked ZnO on the structural and optical properties of heterostructured ZnO/Ga2O3 films
Optical Materials: X
ZnO/Ga2O3
Heterojunction
Heterostructure
Semiconductor
Optical properties
title Influence of the content of stacked ZnO on the structural and optical properties of heterostructured ZnO/Ga2O3 films
title_full Influence of the content of stacked ZnO on the structural and optical properties of heterostructured ZnO/Ga2O3 films
title_fullStr Influence of the content of stacked ZnO on the structural and optical properties of heterostructured ZnO/Ga2O3 films
title_full_unstemmed Influence of the content of stacked ZnO on the structural and optical properties of heterostructured ZnO/Ga2O3 films
title_short Influence of the content of stacked ZnO on the structural and optical properties of heterostructured ZnO/Ga2O3 films
title_sort influence of the content of stacked zno on the structural and optical properties of heterostructured zno ga2o3 films
topic ZnO/Ga2O3
Heterojunction
Heterostructure
Semiconductor
Optical properties
url http://www.sciencedirect.com/science/article/pii/S2590147824000032
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