Time domain thermoreflectance measurements and phonon gas modeling of the thermal conductivity of silicon doped indium phosphide pertinent to quantum cascade lasers

Time domain thermoreflectance measurements and phonon gas modeling of the thermal conductivity of silicon doped indium phosphide pertinent to quantum cascade lasers

The thermal conductivity of Si-doped thin films of indium phosphide grown via metalorganic vapour-phase epitaxy at different carrier concentrations and thicknesses was measured from 80 to 450 K using time domain thermoreflectance. Additionally, phonon gas modeling was conducted to characterize the v...

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Bibliographic Details
Main Authors: C. Perez, D. Talreja, J. Kirch, S. Zhang, V. Gopalan, D. Botez, B. M. Foley, B. Ramos-Alvarado, L. J. Mawst
Format: Article
Language:English
Published: AIP Publishing LLC 2023-04-01
Series:APL Materials
Online Access:http://dx.doi.org/10.1063/5.0141252

Internet

http://dx.doi.org/10.1063/5.0141252

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