Eddy Current Measurement for Planar Structures
Eddy current (EC) testing has become one of the most common techniques for measuring metallic planar structures in various industrial scenarios such as infrastructures, automotive, manufacturing, and chemical engineering. There has been significant progress in measuring the geometry, electromagnetic...
| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
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MDPI AG
2022-11-01
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| Series: | Sensors |
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| Online Access: | https://www.mdpi.com/1424-8220/22/22/8695 |
| _version_ | 1797464056028725248 |
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| author | Zihan Xia Ruochen Huang Ziqi Chen Kuohai Yu Zhijie Zhang Jorge Ricardo Salas-Avila Wuliang Yin |
| author_facet | Zihan Xia Ruochen Huang Ziqi Chen Kuohai Yu Zhijie Zhang Jorge Ricardo Salas-Avila Wuliang Yin |
| author_sort | Zihan Xia |
| collection | DOAJ |
| description | Eddy current (EC) testing has become one of the most common techniques for measuring metallic planar structures in various industrial scenarios such as infrastructures, automotive, manufacturing, and chemical engineering. There has been significant progress in measuring the geometry, electromagnetic properties, and defects of metallic planar structures based on electromagnetic principles. In this review, we summarize recent developments in EC computational models, systems, algorithms, and measurement approaches for planar structures. First, the computational models including analytical models, numerical methods, and plate property estimation algorithms are introduced. Subsequently, the impedance measurement system and probes are presented. In plate measurements, sensor signals are sensitive to probe lift-off, and various algorithms for reducing the lift-off effect are reviewed. These approaches can be used for measureing thickness and electromagnetic properties. Furthermore, defect detection for metallic plates is also discussed. |
| first_indexed | 2024-03-09T18:01:32Z |
| format | Article |
| id | doaj.art-e911285881c84769b9e60b0c713681c2 |
| institution | Directory Open Access Journal |
| issn | 1424-8220 |
| language | English |
| last_indexed | 2024-03-09T18:01:32Z |
| publishDate | 2022-11-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Sensors |
| spelling | doaj.art-e911285881c84769b9e60b0c713681c22023-11-24T09:54:16ZengMDPI AGSensors1424-82202022-11-012222869510.3390/s22228695Eddy Current Measurement for Planar StructuresZihan Xia0Ruochen Huang1Ziqi Chen2Kuohai Yu3Zhijie Zhang4Jorge Ricardo Salas-Avila5Wuliang Yin6School of Electrical and Electronic Engineering, University of Manchester, Manchester M13 9PL, UKCollege of Electrical Engineering and Automation, Fuzhou University, Fuzhou 350108, ChinaSchool of Electrical and Electronic Engineering, University of Manchester, Manchester M13 9PL, UKSchool of Electrical and Electronic Engineering, University of Manchester, Manchester M13 9PL, UKSchool of Instrument and Electronics, North University of China, Taiyuan 030051, ChinaMAIERIC Ltd., Manchester M15 6SZ, UKSchool of Electrical and Electronic Engineering, University of Manchester, Manchester M13 9PL, UKEddy current (EC) testing has become one of the most common techniques for measuring metallic planar structures in various industrial scenarios such as infrastructures, automotive, manufacturing, and chemical engineering. There has been significant progress in measuring the geometry, electromagnetic properties, and defects of metallic planar structures based on electromagnetic principles. In this review, we summarize recent developments in EC computational models, systems, algorithms, and measurement approaches for planar structures. First, the computational models including analytical models, numerical methods, and plate property estimation algorithms are introduced. Subsequently, the impedance measurement system and probes are presented. In plate measurements, sensor signals are sensitive to probe lift-off, and various algorithms for reducing the lift-off effect are reviewed. These approaches can be used for measureing thickness and electromagnetic properties. Furthermore, defect detection for metallic plates is also discussed.https://www.mdpi.com/1424-8220/22/22/8695eddy current testingelectromagnetic inductionplanar structuretheoretical calculationmeasurement |
| spellingShingle | Zihan Xia Ruochen Huang Ziqi Chen Kuohai Yu Zhijie Zhang Jorge Ricardo Salas-Avila Wuliang Yin Eddy Current Measurement for Planar Structures Sensors eddy current testing electromagnetic induction planar structure theoretical calculation measurement |
| title | Eddy Current Measurement for Planar Structures |
| title_full | Eddy Current Measurement for Planar Structures |
| title_fullStr | Eddy Current Measurement for Planar Structures |
| title_full_unstemmed | Eddy Current Measurement for Planar Structures |
| title_short | Eddy Current Measurement for Planar Structures |
| title_sort | eddy current measurement for planar structures |
| topic | eddy current testing electromagnetic induction planar structure theoretical calculation measurement |
| url | https://www.mdpi.com/1424-8220/22/22/8695 |
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