Characterization of an X-ray Source Generated by a Portable Low-Current X-Pinch

An X-pinch scheme of a low-current generator (45 kA, 50 ns rise time) is characterized as a potential efficient source of soft X-rays. The X-pinch target consists of wires of 5 μm in diameter—made from either tungsten (W) or gold (Au)-plated W—loaded at two angles of 55° and 98° between the crossed...

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Main Authors: Alexandros Skoulakis, Evaggelos Kaselouris, Antonis Kavroulakis, Christos Karvounis, Ioannis Fitilis, John Chatzakis, Vasilis Dimitriou, Nektarios A. Papadogiannis, Michael Tatarakis
Format: Article
Language:English
Published: MDPI AG 2021-11-01
Series:Applied Sciences
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Online Access:https://www.mdpi.com/2076-3417/11/23/11173
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author Alexandros Skoulakis
Evaggelos Kaselouris
Antonis Kavroulakis
Christos Karvounis
Ioannis Fitilis
John Chatzakis
Vasilis Dimitriou
Nektarios A. Papadogiannis
Michael Tatarakis
author_facet Alexandros Skoulakis
Evaggelos Kaselouris
Antonis Kavroulakis
Christos Karvounis
Ioannis Fitilis
John Chatzakis
Vasilis Dimitriou
Nektarios A. Papadogiannis
Michael Tatarakis
author_sort Alexandros Skoulakis
collection DOAJ
description An X-pinch scheme of a low-current generator (45 kA, 50 ns rise time) is characterized as a potential efficient source of soft X-rays. The X-pinch target consists of wires of 5 μm in diameter—made from either tungsten (W) or gold (Au)-plated W—loaded at two angles of 55° and 98° between the crossed wires. Time-resolved soft X-ray emission measurements are performed to provide a secure correlation with the optical probing results. A reconstruction of the actual photodiode current profile procedure was adopted, capable of overcoming the limits of the slow rising and falling times due to the “slow” response of the diodes and the noise. The pure and Au-plated W deliver an average X-ray yield, which depends only on the angle of the crossed wires, and is measured to be ~50 mJ and ~70 mJ for the 98° and 55° crossed wire angles, respectively. An additional experimental setup was developed to characterize the X-pinch as a source of X-rays with energy higher than ~6 keV, via time-integrated measurements. The X-ray emission spectrum was found to have an upper limit at 13 keV for the Au-plated W configuration at 55°. The portable tabletop X-pinch proved to be ideal for use in X-ray radiography applications, such as the detection of interior defects in biological samples.
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spelling doaj.art-e979db9abecd459ea683faf9ff4a05b12023-11-23T02:03:46ZengMDPI AGApplied Sciences2076-34172021-11-0111231117310.3390/app112311173Characterization of an X-ray Source Generated by a Portable Low-Current X-PinchAlexandros Skoulakis0Evaggelos Kaselouris1Antonis Kavroulakis2Christos Karvounis3Ioannis Fitilis4John Chatzakis5Vasilis Dimitriou6Nektarios A. Papadogiannis7Michael Tatarakis8Institute of Plasma Physics & Lasers—IPPL, Hellenic Mediterranean University Research Centre, Tria Monastiria, 74100 Rethymno, GreeceInstitute of Plasma Physics & Lasers—IPPL, Hellenic Mediterranean University Research Centre, Tria Monastiria, 74100 Rethymno, GreeceInstitute of Plasma Physics & Lasers—IPPL, Hellenic Mediterranean University Research Centre, Tria Monastiria, 74100 Rethymno, GreeceInstitute of Plasma Physics & Lasers—IPPL, Hellenic Mediterranean University Research Centre, Tria Monastiria, 74100 Rethymno, GreeceInstitute of Plasma Physics & Lasers—IPPL, Hellenic Mediterranean University Research Centre, Tria Monastiria, 74100 Rethymno, GreeceInstitute of Plasma Physics & Lasers—IPPL, Hellenic Mediterranean University Research Centre, Tria Monastiria, 74100 Rethymno, GreeceInstitute of Plasma Physics & Lasers—IPPL, Hellenic Mediterranean University Research Centre, Tria Monastiria, 74100 Rethymno, GreeceInstitute of Plasma Physics & Lasers—IPPL, Hellenic Mediterranean University Research Centre, Tria Monastiria, 74100 Rethymno, GreeceInstitute of Plasma Physics & Lasers—IPPL, Hellenic Mediterranean University Research Centre, Tria Monastiria, 74100 Rethymno, GreeceAn X-pinch scheme of a low-current generator (45 kA, 50 ns rise time) is characterized as a potential efficient source of soft X-rays. The X-pinch target consists of wires of 5 μm in diameter—made from either tungsten (W) or gold (Au)-plated W—loaded at two angles of 55° and 98° between the crossed wires. Time-resolved soft X-ray emission measurements are performed to provide a secure correlation with the optical probing results. A reconstruction of the actual photodiode current profile procedure was adopted, capable of overcoming the limits of the slow rising and falling times due to the “slow” response of the diodes and the noise. The pure and Au-plated W deliver an average X-ray yield, which depends only on the angle of the crossed wires, and is measured to be ~50 mJ and ~70 mJ for the 98° and 55° crossed wire angles, respectively. An additional experimental setup was developed to characterize the X-pinch as a source of X-rays with energy higher than ~6 keV, via time-integrated measurements. The X-ray emission spectrum was found to have an upper limit at 13 keV for the Au-plated W configuration at 55°. The portable tabletop X-pinch proved to be ideal for use in X-ray radiography applications, such as the detection of interior defects in biological samples.https://www.mdpi.com/2076-3417/11/23/11173X-pinchsoft X-raysX-ray radiography
spellingShingle Alexandros Skoulakis
Evaggelos Kaselouris
Antonis Kavroulakis
Christos Karvounis
Ioannis Fitilis
John Chatzakis
Vasilis Dimitriou
Nektarios A. Papadogiannis
Michael Tatarakis
Characterization of an X-ray Source Generated by a Portable Low-Current X-Pinch
Applied Sciences
X-pinch
soft X-rays
X-ray radiography
title Characterization of an X-ray Source Generated by a Portable Low-Current X-Pinch
title_full Characterization of an X-ray Source Generated by a Portable Low-Current X-Pinch
title_fullStr Characterization of an X-ray Source Generated by a Portable Low-Current X-Pinch
title_full_unstemmed Characterization of an X-ray Source Generated by a Portable Low-Current X-Pinch
title_short Characterization of an X-ray Source Generated by a Portable Low-Current X-Pinch
title_sort characterization of an x ray source generated by a portable low current x pinch
topic X-pinch
soft X-rays
X-ray radiography
url https://www.mdpi.com/2076-3417/11/23/11173
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