Minimizing electrostatic interactions from piezoresponse force microscopy via capacitive excitation
Piezoresponse force microscopy (PFM) has emerged as one of the most powerful techniques to probe ferroelectric materials at the nanoscale, yet it has been increasingly recognized that piezoresponse measured by PFM is often influenced by electrostatic interactions. In this letter, we report a capacit...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2020-01-01
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| Series: | Theoretical and Applied Mechanics Letters |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S2095034920300052 |