The DFA/DFT‐based hacking techniques and countermeasures: Case study of the 32‐bit AES encryption crypto‐core
Abstract Integrated circuits (ICs) design plays a significant role in the embedded‐system performance, reliability and security. Thus, the constant advances in very large‐scale integration technology have led to design and manufacture of very complex ICs based on the System on a Chip (SoC) approach...
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Format: | Article |
Language: | English |
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Hindawi-IET
2021-03-01
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Series: | IET Computers & Digital Techniques |
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Online Access: | https://doi.org/10.1049/cdt2.12013 |
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author | Mouna Karmani Noura Benhadjyoussef Belgacem Hamdi Mohsen Machhout |
author_facet | Mouna Karmani Noura Benhadjyoussef Belgacem Hamdi Mohsen Machhout |
author_sort | Mouna Karmani |
collection | DOAJ |
description | Abstract Integrated circuits (ICs) design plays a significant role in the embedded‐system performance, reliability and security. Thus, the constant advances in very large‐scale integration technology have led to design and manufacture of very complex ICs based on the System on a Chip (SoC) approach design. Therefore, the embedded system testing is considered earlier during the design process and testability is used as one of the objectives for evaluating safety‐critical embedded system designs. On the other hand, embedded systems used in critical applications execute security‐critical commands and collect sensitive data protected by cryptographic keys and authentication codes. The data and the unauthorised access of these embedded devices is an obvious target for attackers in order to obtain control or extract internal data. In this paper we consider that by using Design for Testability (DFT) approaches an attacker can control and affect a security‐critical embedded system. Thus, the authors focus on the DFT approach, as a means of violation of the security and confidentiality of embedded systems with security‐critical goals. In addition, with or without insertion of DFT circuitry, the crypto‐core is always exposed to the powerful differential fault analysis (DFA) attack. Here, a 32‐bit AES crypto‐core is used as a case study in order to analyse the DFA‐ and the DFT‐based Hacking techniques. A countermeasure was performed in order to avoid any scan or even DFA attack attempt. |
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institution | Directory Open Access Journal |
issn | 1751-8601 1751-861X |
language | English |
last_indexed | 2025-03-20T02:51:28Z |
publishDate | 2021-03-01 |
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series | IET Computers & Digital Techniques |
spelling | doaj.art-e9c0b29999d4443c910c93ff8d82f7ef2024-10-03T07:27:21ZengHindawi-IETIET Computers & Digital Techniques1751-86011751-861X2021-03-0115216017010.1049/cdt2.12013The DFA/DFT‐based hacking techniques and countermeasures: Case study of the 32‐bit AES encryption crypto‐coreMouna Karmani0Noura Benhadjyoussef1Belgacem Hamdi2Mohsen Machhout3Physic Department Faculty of Sciences of Monastir Electronics and Micro‐Electronics Laboratory Monastir TunisiaPhysic Department Faculty of Sciences of Monastir Electronics and Micro‐Electronics Laboratory Monastir TunisiaPhysic Department Faculty of Sciences of Monastir Electronics and Micro‐Electronics Laboratory Monastir TunisiaPhysic Department Faculty of Sciences of Monastir Electronics and Micro‐Electronics Laboratory Monastir TunisiaAbstract Integrated circuits (ICs) design plays a significant role in the embedded‐system performance, reliability and security. Thus, the constant advances in very large‐scale integration technology have led to design and manufacture of very complex ICs based on the System on a Chip (SoC) approach design. Therefore, the embedded system testing is considered earlier during the design process and testability is used as one of the objectives for evaluating safety‐critical embedded system designs. On the other hand, embedded systems used in critical applications execute security‐critical commands and collect sensitive data protected by cryptographic keys and authentication codes. The data and the unauthorised access of these embedded devices is an obvious target for attackers in order to obtain control or extract internal data. In this paper we consider that by using Design for Testability (DFT) approaches an attacker can control and affect a security‐critical embedded system. Thus, the authors focus on the DFT approach, as a means of violation of the security and confidentiality of embedded systems with security‐critical goals. In addition, with or without insertion of DFT circuitry, the crypto‐core is always exposed to the powerful differential fault analysis (DFA) attack. Here, a 32‐bit AES crypto‐core is used as a case study in order to analyse the DFA‐ and the DFT‐based Hacking techniques. A countermeasure was performed in order to avoid any scan or even DFA attack attempt.https://doi.org/10.1049/cdt2.12013computer crimecryptographydesign for testabilityembedded systemsintegrated circuit design |
spellingShingle | Mouna Karmani Noura Benhadjyoussef Belgacem Hamdi Mohsen Machhout The DFA/DFT‐based hacking techniques and countermeasures: Case study of the 32‐bit AES encryption crypto‐core IET Computers & Digital Techniques computer crime cryptography design for testability embedded systems integrated circuit design |
title | The DFA/DFT‐based hacking techniques and countermeasures: Case study of the 32‐bit AES encryption crypto‐core |
title_full | The DFA/DFT‐based hacking techniques and countermeasures: Case study of the 32‐bit AES encryption crypto‐core |
title_fullStr | The DFA/DFT‐based hacking techniques and countermeasures: Case study of the 32‐bit AES encryption crypto‐core |
title_full_unstemmed | The DFA/DFT‐based hacking techniques and countermeasures: Case study of the 32‐bit AES encryption crypto‐core |
title_short | The DFA/DFT‐based hacking techniques and countermeasures: Case study of the 32‐bit AES encryption crypto‐core |
title_sort | dfa dft based hacking techniques and countermeasures case study of the 32 bit aes encryption crypto core |
topic | computer crime cryptography design for testability embedded systems integrated circuit design |
url | https://doi.org/10.1049/cdt2.12013 |
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