Possibilities and limitations of advanced transmission electron microscopy for carbon-based nanomaterials
A major revolution for electron microscopy in the past decade is the introduction of aberration correction, which enables one to increase both the spatial resolution and the energy resolution to the optical limit. Aberration correction has contributed significantly to the imaging at low operating vo...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
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Beilstein-Institut
2015-07-01
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| Series: | Beilstein Journal of Nanotechnology |
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| Online Access: | https://doi.org/10.3762/bjnano.6.158 |
| _version_ | 1818594796762038272 |
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| author | Xiaoxing Ke Carla Bittencourt Gustaaf Van Tendeloo |
| author_facet | Xiaoxing Ke Carla Bittencourt Gustaaf Van Tendeloo |
| author_sort | Xiaoxing Ke |
| collection | DOAJ |
| description | A major revolution for electron microscopy in the past decade is the introduction of aberration correction, which enables one to increase both the spatial resolution and the energy resolution to the optical limit. Aberration correction has contributed significantly to the imaging at low operating voltages. This is crucial for carbon-based nanomaterials which are sensitive to electron irradiation. The research of carbon nanomaterials and nanohybrids, in particular the fundamental understanding of defects and interfaces, can now be carried out in unprecedented detail by aberration-corrected transmission electron microscopy (AC-TEM). This review discusses new possibilities and limits of AC-TEM at low voltage, including the structural imaging at atomic resolution, in three dimensions and spectroscopic investigation of chemistry and bonding. In situ TEM of carbon-based nanomaterials is discussed and illustrated through recent reports with particular emphasis on the underlying physics of interactions between electrons and carbon atoms. |
| first_indexed | 2024-12-16T11:05:49Z |
| format | Article |
| id | doaj.art-ea3d7474cf3347119cda8b52e3ceda78 |
| institution | Directory Open Access Journal |
| issn | 2190-4286 |
| language | English |
| last_indexed | 2024-12-16T11:05:49Z |
| publishDate | 2015-07-01 |
| publisher | Beilstein-Institut |
| record_format | Article |
| series | Beilstein Journal of Nanotechnology |
| spelling | doaj.art-ea3d7474cf3347119cda8b52e3ceda782022-12-21T22:33:51ZengBeilstein-InstitutBeilstein Journal of Nanotechnology2190-42862015-07-01611541155710.3762/bjnano.6.1582190-4286-6-158Possibilities and limitations of advanced transmission electron microscopy for carbon-based nanomaterialsXiaoxing Ke0Carla Bittencourt1Gustaaf Van Tendeloo2EMAT, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, BelgiumChemistry of Interaction Plasma Surface (ChiPS), University of Mons, Place du Parc 20, 7000 Mons, BelgiumEMAT, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, BelgiumA major revolution for electron microscopy in the past decade is the introduction of aberration correction, which enables one to increase both the spatial resolution and the energy resolution to the optical limit. Aberration correction has contributed significantly to the imaging at low operating voltages. This is crucial for carbon-based nanomaterials which are sensitive to electron irradiation. The research of carbon nanomaterials and nanohybrids, in particular the fundamental understanding of defects and interfaces, can now be carried out in unprecedented detail by aberration-corrected transmission electron microscopy (AC-TEM). This review discusses new possibilities and limits of AC-TEM at low voltage, including the structural imaging at atomic resolution, in three dimensions and spectroscopic investigation of chemistry and bonding. In situ TEM of carbon-based nanomaterials is discussed and illustrated through recent reports with particular emphasis on the underlying physics of interactions between electrons and carbon atoms.https://doi.org/10.3762/bjnano.6.158TEMaberration-correctedcarbonnanostructureslow-kV imaging |
| spellingShingle | Xiaoxing Ke Carla Bittencourt Gustaaf Van Tendeloo Possibilities and limitations of advanced transmission electron microscopy for carbon-based nanomaterials Beilstein Journal of Nanotechnology TEM aberration-corrected carbon nanostructures low-kV imaging |
| title | Possibilities and limitations of advanced transmission electron microscopy for carbon-based nanomaterials |
| title_full | Possibilities and limitations of advanced transmission electron microscopy for carbon-based nanomaterials |
| title_fullStr | Possibilities and limitations of advanced transmission electron microscopy for carbon-based nanomaterials |
| title_full_unstemmed | Possibilities and limitations of advanced transmission electron microscopy for carbon-based nanomaterials |
| title_short | Possibilities and limitations of advanced transmission electron microscopy for carbon-based nanomaterials |
| title_sort | possibilities and limitations of advanced transmission electron microscopy for carbon based nanomaterials |
| topic | TEM aberration-corrected carbon nanostructures low-kV imaging |
| url | https://doi.org/10.3762/bjnano.6.158 |
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