Facile Construction of a Laser Scanning Optical Beam Induced Current Microscope
We report on the design and construction of a laser scanning optical beam-induced current (OBIC) microscope by assembling cost-effective commercial optical and electronic hardware components and developing data acquisition and control software in LabVIEW. A preliminary OBIC image of a Si photodetect...
| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
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IEEE
2024-01-01
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| Series: | IEEE Photonics Journal |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/10380660/ |
| _version_ | 1827127012575150080 |
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| author | Ankita Buragohain Nayan M. Kakoty Guan-Yu Zhuo Gazi A. Ahmed Fu-Jen Kao Nirmal Mazumder Ankur Gogoi |
| author_facet | Ankita Buragohain Nayan M. Kakoty Guan-Yu Zhuo Gazi A. Ahmed Fu-Jen Kao Nirmal Mazumder Ankur Gogoi |
| author_sort | Ankita Buragohain |
| collection | DOAJ |
| description | We report on the design and construction of a laser scanning optical beam-induced current (OBIC) microscope by assembling cost-effective commercial optical and electronic hardware components and developing data acquisition and control software in LabVIEW. A preliminary OBIC image of a Si photodetector acquired by the developed microscope is presented to demonstrate its operational capability. The versatility of the design will allow for the construction of other scanning microscope modalities on the same platform. |
| first_indexed | 2024-03-08T09:44:12Z |
| format | Article |
| id | doaj.art-ea74148a9c5149c6b9d985068da1662e |
| institution | Directory Open Access Journal |
| issn | 1943-0655 |
| language | English |
| last_indexed | 2025-03-20T15:21:44Z |
| publishDate | 2024-01-01 |
| publisher | IEEE |
| record_format | Article |
| series | IEEE Photonics Journal |
| spelling | doaj.art-ea74148a9c5149c6b9d985068da1662e2024-09-04T23:00:04ZengIEEEIEEE Photonics Journal1943-06552024-01-011611510.1109/JPHOT.2024.334993010380660Facile Construction of a Laser Scanning Optical Beam Induced Current MicroscopeAnkita Buragohain0https://orcid.org/0000-0002-1378-9552Nayan M. Kakoty1https://orcid.org/0000-0002-3608-1215Guan-Yu Zhuo2https://orcid.org/0000-0002-9813-2989Gazi A. Ahmed3https://orcid.org/0000-0002-0631-4831Fu-Jen Kao4https://orcid.org/0000-0001-8361-3942Nirmal Mazumder5https://orcid.org/0000-0001-8068-6484Ankur Gogoi6https://orcid.org/0000-0001-6255-6862Embedded Systems and Robotics Lab, School of Engineering, Tezpur University, Tezpur, Assam, IndiaEmbedded Systems and Robotics Lab, School of Engineering, Tezpur University, Tezpur, Assam, IndiaInstitute of Translational Medicine and New Drug Development, China Medical University, Taichung, TaiwanDepartment of Physics, Tezpur University, Tezpur, Assam, IndiaInstitute of Biophotonics, National Yang-Ming Chiao Tung University, Taipei, TaiwanDepartment of Biophysics, Manipal School of Life Sciences, Manipal Academy of Higher Education, Manipal, Karnataka, IndiaDepartment of Physics, Jagannath Barooah College, Jorhat, Assam, IndiaWe report on the design and construction of a laser scanning optical beam-induced current (OBIC) microscope by assembling cost-effective commercial optical and electronic hardware components and developing data acquisition and control software in LabVIEW. A preliminary OBIC image of a Si photodetector acquired by the developed microscope is presented to demonstrate its operational capability. The versatility of the design will allow for the construction of other scanning microscope modalities on the same platform.https://ieeexplore.ieee.org/document/10380660/Current measurementdata acquisitionfailure analysisoptical imagingmicroscopysemiconductor device testing |
| spellingShingle | Ankita Buragohain Nayan M. Kakoty Guan-Yu Zhuo Gazi A. Ahmed Fu-Jen Kao Nirmal Mazumder Ankur Gogoi Facile Construction of a Laser Scanning Optical Beam Induced Current Microscope IEEE Photonics Journal Current measurement data acquisition failure analysis optical imaging microscopy semiconductor device testing |
| title | Facile Construction of a Laser Scanning Optical Beam Induced Current Microscope |
| title_full | Facile Construction of a Laser Scanning Optical Beam Induced Current Microscope |
| title_fullStr | Facile Construction of a Laser Scanning Optical Beam Induced Current Microscope |
| title_full_unstemmed | Facile Construction of a Laser Scanning Optical Beam Induced Current Microscope |
| title_short | Facile Construction of a Laser Scanning Optical Beam Induced Current Microscope |
| title_sort | facile construction of a laser scanning optical beam induced current microscope |
| topic | Current measurement data acquisition failure analysis optical imaging microscopy semiconductor device testing |
| url | https://ieeexplore.ieee.org/document/10380660/ |
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