Facile Construction of a Laser Scanning Optical Beam Induced Current Microscope

Facile Construction of a Laser Scanning Optical Beam Induced Current Microscope

We report on the design and construction of a laser scanning optical beam-induced current (OBIC) microscope by assembling cost-effective commercial optical and electronic hardware components and developing data acquisition and control software in LabVIEW. A preliminary OBIC image of a Si photodetect...

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Bibliographic Details
Main Authors: Ankita Buragohain, Nayan M. Kakoty, Guan-Yu Zhuo, Gazi A. Ahmed, Fu-Jen Kao, Nirmal Mazumder, Ankur Gogoi
Format: Article
Language:English
Published: IEEE 2024-01-01
Series:IEEE Photonics Journal
Subjects:
Current measurement
data acquisition
failure analysis
optical imaging
microscopy
semiconductor device testing
Online Access:https://ieeexplore.ieee.org/document/10380660/

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