Microstructure Evolution of Ag/TiO<sub>2</sub> Thin Film
Ag/TiO<sub>2</sub> thin films were prepared using the sol-gel spin coating method. The microstructural growth behaviors of the prepared Ag/TiO<sub>2</sub> thin films were elucidated using real-time synchrotron radiation imaging, its structure was determined using grazing inci...
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MDPI AG
2021-01-01
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author | Dewi Suriyani Che Halin Kamrosni Abdul Razak Mohd Arif Anuar Mohd Salleh Mohd Izrul Izwan Ramli Mohd Mustafa Al Bakri Abdullah Ayu Wazira Azhari Kazuhiro Nogita Hideyuki Yasuda Marcin Nabiałek Jerzy J. Wysłocki |
author_facet | Dewi Suriyani Che Halin Kamrosni Abdul Razak Mohd Arif Anuar Mohd Salleh Mohd Izrul Izwan Ramli Mohd Mustafa Al Bakri Abdullah Ayu Wazira Azhari Kazuhiro Nogita Hideyuki Yasuda Marcin Nabiałek Jerzy J. Wysłocki |
author_sort | Dewi Suriyani Che Halin |
collection | DOAJ |
description | Ag/TiO<sub>2</sub> thin films were prepared using the sol-gel spin coating method. The microstructural growth behaviors of the prepared Ag/TiO<sub>2</sub> thin films were elucidated using real-time synchrotron radiation imaging, its structure was determined using grazing incidence X-ray diffraction (GIXRD), its morphology was imaged using the field emission scanning electron microscopy (FESEM), and its surface topography was examined using the atomic force microscope (AFM) in contact mode. The cubical shape was detected and identified as Ag, while the anatase, TiO<sub>2</sub> thin film resembled a porous ring-like structure. It was found that each ring that coalesced and formed channels occurred at a low annealing temperature of 280 °C. The energy dispersive X-ray (EDX) result revealed a small amount of Ag presence in the Ag/TiO<sub>2</sub> thin films. From the in-situ synchrotron radiation imaging, it was observed that as the annealing time increased, the growth of Ag/TiO<sub>2</sub> also increased in terms of area and the number of junctions. The growth rate of Ag/TiO<sub>2</sub> at 600 s was 47.26 µm<sup>2</sup>/s, and after 1200 s it decreased to 11.50 µm<sup>2</sup>/s and 11.55 µm<sup>2</sup>/s at 1800 s. Prolonged annealing will further decrease the growth rate to 5.94 µm<sup>2</sup>/s, 4.12 µm<sup>2</sup>/s and 4.86 µm<sup>2</sup>/s at 2400 s, 3000 s and 3600 s, respectively. |
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issn | 2312-7481 |
language | English |
last_indexed | 2024-03-09T04:34:24Z |
publishDate | 2021-01-01 |
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spelling | doaj.art-ea88f1d75dad40ac9f6d9b4cc740a8352023-12-03T13:31:09ZengMDPI AGMagnetochemistry2312-74812021-01-01711410.3390/magnetochemistry7010014Microstructure Evolution of Ag/TiO<sub>2</sub> Thin FilmDewi Suriyani Che Halin0Kamrosni Abdul Razak1Mohd Arif Anuar Mohd Salleh2Mohd Izrul Izwan Ramli3Mohd Mustafa Al Bakri Abdullah4Ayu Wazira Azhari5Kazuhiro Nogita6Hideyuki Yasuda7Marcin Nabiałek8Jerzy J. Wysłocki9Center of Excellence Geopolymer & Green Technology (CEGeoGTech), Universiti Malaysia Perlis, (UniMAP), Jalan Kangar-Arau, Perlis 02600, MalaysiaCenter of Excellence Geopolymer & Green Technology (CEGeoGTech), Universiti Malaysia Perlis, (UniMAP), Jalan Kangar-Arau, Perlis 02600, MalaysiaCenter of Excellence Geopolymer & Green Technology (CEGeoGTech), Universiti Malaysia Perlis, (UniMAP), Jalan Kangar-Arau, Perlis 02600, MalaysiaCenter of Excellence Geopolymer & Green Technology (CEGeoGTech), Universiti Malaysia Perlis, (UniMAP), Jalan Kangar-Arau, Perlis 02600, MalaysiaCenter of Excellence Geopolymer & Green Technology (CEGeoGTech), Universiti Malaysia Perlis, (UniMAP), Jalan Kangar-Arau, Perlis 02600, MalaysiaFaculty of Civil Engineering Technology, Universiti Malaysia Perlis, Jalan Kangar-Arau, Perlis 02600, MalaysiaNihon Superior Centre for the Manufacture of Electronic Materials (NS CMEM), School of Mechanical and Mining Engineering, The University of Queensland (UQ), Brisbane, QLD 4072, AustraliaDepartment of Materials Science and Engineering, Kyoto University, Sakyo-ku, Kyoto 606-8501, JapanDepartment of Physics, Czestochowa University of Technology, al. Armii Krajowej 19, 42-200 Częstochowa, PolandDepartment of Physics, Czestochowa University of Technology, al. Armii Krajowej 19, 42-200 Częstochowa, PolandAg/TiO<sub>2</sub> thin films were prepared using the sol-gel spin coating method. The microstructural growth behaviors of the prepared Ag/TiO<sub>2</sub> thin films were elucidated using real-time synchrotron radiation imaging, its structure was determined using grazing incidence X-ray diffraction (GIXRD), its morphology was imaged using the field emission scanning electron microscopy (FESEM), and its surface topography was examined using the atomic force microscope (AFM) in contact mode. The cubical shape was detected and identified as Ag, while the anatase, TiO<sub>2</sub> thin film resembled a porous ring-like structure. It was found that each ring that coalesced and formed channels occurred at a low annealing temperature of 280 °C. The energy dispersive X-ray (EDX) result revealed a small amount of Ag presence in the Ag/TiO<sub>2</sub> thin films. From the in-situ synchrotron radiation imaging, it was observed that as the annealing time increased, the growth of Ag/TiO<sub>2</sub> also increased in terms of area and the number of junctions. The growth rate of Ag/TiO<sub>2</sub> at 600 s was 47.26 µm<sup>2</sup>/s, and after 1200 s it decreased to 11.50 µm<sup>2</sup>/s and 11.55 µm<sup>2</sup>/s at 1800 s. Prolonged annealing will further decrease the growth rate to 5.94 µm<sup>2</sup>/s, 4.12 µm<sup>2</sup>/s and 4.86 µm<sup>2</sup>/s at 2400 s, 3000 s and 3600 s, respectively.https://www.mdpi.com/2312-7481/7/1/14microstructuretitanium dioxidethin filmSol-Gelsynchrotron radiation imaging |
spellingShingle | Dewi Suriyani Che Halin Kamrosni Abdul Razak Mohd Arif Anuar Mohd Salleh Mohd Izrul Izwan Ramli Mohd Mustafa Al Bakri Abdullah Ayu Wazira Azhari Kazuhiro Nogita Hideyuki Yasuda Marcin Nabiałek Jerzy J. Wysłocki Microstructure Evolution of Ag/TiO<sub>2</sub> Thin Film Magnetochemistry microstructure titanium dioxide thin film Sol-Gel synchrotron radiation imaging |
title | Microstructure Evolution of Ag/TiO<sub>2</sub> Thin Film |
title_full | Microstructure Evolution of Ag/TiO<sub>2</sub> Thin Film |
title_fullStr | Microstructure Evolution of Ag/TiO<sub>2</sub> Thin Film |
title_full_unstemmed | Microstructure Evolution of Ag/TiO<sub>2</sub> Thin Film |
title_short | Microstructure Evolution of Ag/TiO<sub>2</sub> Thin Film |
title_sort | microstructure evolution of ag tio sub 2 sub thin film |
topic | microstructure titanium dioxide thin film Sol-Gel synchrotron radiation imaging |
url | https://www.mdpi.com/2312-7481/7/1/14 |
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