Crackling noise microscopy
Abstract Crackling noise is a scale-invariant phenomenon found in various driven nonlinear dynamical material systems as a response to external stimuli such as force or external fields. Jerky material movements in the form of avalanches can span many orders of magnitude in size and follow universal...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
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Nature Portfolio
2023-08-01
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| Series: | Nature Communications |
| Online Access: | https://doi.org/10.1038/s41467-023-40665-4 |
| _version_ | 1797557908993474560 |
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| author | Cam-Phu Thi Nguyen Peggy Schoenherr Ekhard K. H. Salje Jan Seidel |
| author_facet | Cam-Phu Thi Nguyen Peggy Schoenherr Ekhard K. H. Salje Jan Seidel |
| author_sort | Cam-Phu Thi Nguyen |
| collection | DOAJ |
| description | Abstract Crackling noise is a scale-invariant phenomenon found in various driven nonlinear dynamical material systems as a response to external stimuli such as force or external fields. Jerky material movements in the form of avalanches can span many orders of magnitude in size and follow universal scaling rules described by power laws. The concept was originally studied as Barkhausen noise in magnetic materials and now is used in diverse fields from earthquake research and building materials monitoring to fundamental research involving phase transitions and neural networks. Here, we demonstrate a method for nanoscale crackling noise measurements based on AFM nanoindentation, where the AFM probe can be used to study the crackling of individual nanoscale features, a technique we call crackling noise microscopy. The method is successfully applied to investigate the crackling of individual topological defects, i.e. ferroelectric domain walls. We show that critical exponents for avalanches are altered at these nanoscale features, leading to a suppression of mixed-criticality, which is otherwise present in domains. The presented concept opens the possibility of investigating the crackling of individual nanoscale features in a wide range of material systems. |
| first_indexed | 2024-03-10T17:22:56Z |
| format | Article |
| id | doaj.art-ebc712beb1274cfa86e5fbc3f0e641ee |
| institution | Directory Open Access Journal |
| issn | 2041-1723 |
| language | English |
| last_indexed | 2024-03-10T17:22:56Z |
| publishDate | 2023-08-01 |
| publisher | Nature Portfolio |
| record_format | Article |
| series | Nature Communications |
| spelling | doaj.art-ebc712beb1274cfa86e5fbc3f0e641ee2023-11-20T10:17:34ZengNature PortfolioNature Communications2041-17232023-08-011411610.1038/s41467-023-40665-4Crackling noise microscopyCam-Phu Thi Nguyen0Peggy Schoenherr1Ekhard K. H. Salje2Jan Seidel3School of Materials Science and Engineering, UNSW SydneySchool of Materials Science and Engineering, UNSW SydneyDepartment of Earth Sciences, Cambridge UniversitySchool of Materials Science and Engineering, UNSW SydneyAbstract Crackling noise is a scale-invariant phenomenon found in various driven nonlinear dynamical material systems as a response to external stimuli such as force or external fields. Jerky material movements in the form of avalanches can span many orders of magnitude in size and follow universal scaling rules described by power laws. The concept was originally studied as Barkhausen noise in magnetic materials and now is used in diverse fields from earthquake research and building materials monitoring to fundamental research involving phase transitions and neural networks. Here, we demonstrate a method for nanoscale crackling noise measurements based on AFM nanoindentation, where the AFM probe can be used to study the crackling of individual nanoscale features, a technique we call crackling noise microscopy. The method is successfully applied to investigate the crackling of individual topological defects, i.e. ferroelectric domain walls. We show that critical exponents for avalanches are altered at these nanoscale features, leading to a suppression of mixed-criticality, which is otherwise present in domains. The presented concept opens the possibility of investigating the crackling of individual nanoscale features in a wide range of material systems.https://doi.org/10.1038/s41467-023-40665-4 |
| spellingShingle | Cam-Phu Thi Nguyen Peggy Schoenherr Ekhard K. H. Salje Jan Seidel Crackling noise microscopy Nature Communications |
| title | Crackling noise microscopy |
| title_full | Crackling noise microscopy |
| title_fullStr | Crackling noise microscopy |
| title_full_unstemmed | Crackling noise microscopy |
| title_short | Crackling noise microscopy |
| title_sort | crackling noise microscopy |
| url | https://doi.org/10.1038/s41467-023-40665-4 |
| work_keys_str_mv | AT camphuthinguyen cracklingnoisemicroscopy AT peggyschoenherr cracklingnoisemicroscopy AT ekhardkhsalje cracklingnoisemicroscopy AT janseidel cracklingnoisemicroscopy |