Impact of the photoelectric threshold sensitivity on the work function determination—Revealing ultra-low work functions of caesiated surfaces

The exploitation of the photoelectric effect is a prominent method for the in situ measurement of the absolute work function of a surface. In the case of metallic surfaces, the Fowler theory is routinely applied for fitting or extrapolating the measured photoelectric yield data to determine the work...

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Main Authors: A. Heiler, R. Friedl, U. Fantz
Format: Article
Language:English
Published: AIP Publishing LLC 2022-03-01
Series:AIP Advances
Online Access:http://dx.doi.org/10.1063/5.0078380
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author A. Heiler
R. Friedl
U. Fantz
author_facet A. Heiler
R. Friedl
U. Fantz
author_sort A. Heiler
collection DOAJ
description The exploitation of the photoelectric effect is a prominent method for the in situ measurement of the absolute work function of a surface. In the case of metallic surfaces, the Fowler theory is routinely applied for fitting or extrapolating the measured photoelectric yield data to determine the work function value. However, for the reliable application of the Fowler method, attention must be paid to the experimental sensitivity to the photoelectric behavior close to the threshold, which is mainly determined by the signal-to-noise ratio for photocurrent detection and the available photon energies used for irradiation. This is illustrated by means of applying a photoelectric work function measurement system during a Cs coating process of a metal surface, where insufficiently low photon energies or an unfavorable noise level can lead to a severe overestimation of the work function of the order of 1 eV. By a sufficient enhancement of the photoelectric sensitivity, it is now unveiled that ultra-low surface work functions of 1.25 ± 0.10 eV can be generated via caesiation of metallic surfaces (here molybdenum and stainless steel) under vacuum conditions of 10−6–10−5 mbar, which is most probably the result of the formation of an oxidized Cs adlayer.
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spelling doaj.art-ec017fd4ae09480582be59ad58e76b222022-12-22T03:20:37ZengAIP Publishing LLCAIP Advances2158-32262022-03-01123035339035339-1110.1063/5.0078380Impact of the photoelectric threshold sensitivity on the work function determination—Revealing ultra-low work functions of caesiated surfacesA. Heiler0R. Friedl1U. Fantz2Max-Planck-Institut für Plasmaphysik, Boltzmannstrasse 2, D-85748 Garching, GermanyAG Experimentelle Plasmaphysik, Universität Augsburg, D-86135 Augsburg, GermanyMax-Planck-Institut für Plasmaphysik, Boltzmannstrasse 2, D-85748 Garching, GermanyThe exploitation of the photoelectric effect is a prominent method for the in situ measurement of the absolute work function of a surface. In the case of metallic surfaces, the Fowler theory is routinely applied for fitting or extrapolating the measured photoelectric yield data to determine the work function value. However, for the reliable application of the Fowler method, attention must be paid to the experimental sensitivity to the photoelectric behavior close to the threshold, which is mainly determined by the signal-to-noise ratio for photocurrent detection and the available photon energies used for irradiation. This is illustrated by means of applying a photoelectric work function measurement system during a Cs coating process of a metal surface, where insufficiently low photon energies or an unfavorable noise level can lead to a severe overestimation of the work function of the order of 1 eV. By a sufficient enhancement of the photoelectric sensitivity, it is now unveiled that ultra-low surface work functions of 1.25 ± 0.10 eV can be generated via caesiation of metallic surfaces (here molybdenum and stainless steel) under vacuum conditions of 10−6–10−5 mbar, which is most probably the result of the formation of an oxidized Cs adlayer.http://dx.doi.org/10.1063/5.0078380
spellingShingle A. Heiler
R. Friedl
U. Fantz
Impact of the photoelectric threshold sensitivity on the work function determination—Revealing ultra-low work functions of caesiated surfaces
AIP Advances
title Impact of the photoelectric threshold sensitivity on the work function determination—Revealing ultra-low work functions of caesiated surfaces
title_full Impact of the photoelectric threshold sensitivity on the work function determination—Revealing ultra-low work functions of caesiated surfaces
title_fullStr Impact of the photoelectric threshold sensitivity on the work function determination—Revealing ultra-low work functions of caesiated surfaces
title_full_unstemmed Impact of the photoelectric threshold sensitivity on the work function determination—Revealing ultra-low work functions of caesiated surfaces
title_short Impact of the photoelectric threshold sensitivity on the work function determination—Revealing ultra-low work functions of caesiated surfaces
title_sort impact of the photoelectric threshold sensitivity on the work function determination revealing ultra low work functions of caesiated surfaces
url http://dx.doi.org/10.1063/5.0078380
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