Refractive Index Measurement With High Precision by a Laser Diode Self-Mixing Interferometer

A new method based on the laser diode self-mixing interference effect for refractive index measurement is demonstrated. It employs a simple translation method to measure the optical phase shift as a function of the moving distance of the sample. The refractive index is determined by analyzing a frin...

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Main Authors: Chenxi Chen, Yongbing Zhang, Xiulin Wang, Xiaozhong Wang, Wencai Huang
Format: Article
Language:English
Published: IEEE 2015-01-01
Series:IEEE Photonics Journal
Subjects:
Online Access:https://ieeexplore.ieee.org/document/7104064/
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author Chenxi Chen
Yongbing Zhang
Xiulin Wang
Xiaozhong Wang
Wencai Huang
author_facet Chenxi Chen
Yongbing Zhang
Xiulin Wang
Xiaozhong Wang
Wencai Huang
author_sort Chenxi Chen
collection DOAJ
description A new method based on the laser diode self-mixing interference effect for refractive index measurement is demonstrated. It employs a simple translation method to measure the optical phase shift as a function of the moving distance of the sample. The refractive index is determined by analyzing a fringe number of self-mixing signals with respect to the moving distance and the incidence angle, with an experimental accuracy of 0.004. Interestingly, the setting error of the proposed system can be effectively decreased by modifying the incidence angle. This method also shows the advantage of a large measurable range of the refractive index.
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spelling doaj.art-ed17f9df0e9541d1bce88979515d00d02022-12-21T22:38:33ZengIEEEIEEE Photonics Journal1943-06552015-01-01731610.1109/JPHOT.2015.24312567104064Refractive Index Measurement With High Precision by a Laser Diode Self-Mixing InterferometerChenxi Chen0Yongbing Zhang1Xiulin Wang2Xiaozhong Wang3Wencai Huang4Dept. of Electron. Eng., Xiamen Univ., Xiamen, ChinaDept. of Electron. Eng., Xiamen Univ., Xiamen, ChinaDept. of Phys., Jimei Univ., Xiamen, ChinaDept. of Electron. Eng., Xiamen Univ., Xiamen, ChinaDept. of Electron. Eng., Xiamen Univ., Xiamen, ChinaA new method based on the laser diode self-mixing interference effect for refractive index measurement is demonstrated. It employs a simple translation method to measure the optical phase shift as a function of the moving distance of the sample. The refractive index is determined by analyzing a fringe number of self-mixing signals with respect to the moving distance and the incidence angle, with an experimental accuracy of 0.004. Interestingly, the setting error of the proposed system can be effectively decreased by modifying the incidence angle. This method also shows the advantage of a large measurable range of the refractive index.https://ieeexplore.ieee.org/document/7104064/Self-mixing interference (SMI)Refractive index
spellingShingle Chenxi Chen
Yongbing Zhang
Xiulin Wang
Xiaozhong Wang
Wencai Huang
Refractive Index Measurement With High Precision by a Laser Diode Self-Mixing Interferometer
IEEE Photonics Journal
Self-mixing interference (SMI)
Refractive index
title Refractive Index Measurement With High Precision by a Laser Diode Self-Mixing Interferometer
title_full Refractive Index Measurement With High Precision by a Laser Diode Self-Mixing Interferometer
title_fullStr Refractive Index Measurement With High Precision by a Laser Diode Self-Mixing Interferometer
title_full_unstemmed Refractive Index Measurement With High Precision by a Laser Diode Self-Mixing Interferometer
title_short Refractive Index Measurement With High Precision by a Laser Diode Self-Mixing Interferometer
title_sort refractive index measurement with high precision by a laser diode self mixing interferometer
topic Self-mixing interference (SMI)
Refractive index
url https://ieeexplore.ieee.org/document/7104064/
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AT xiulinwang refractiveindexmeasurementwithhighprecisionbyalaserdiodeselfmixinginterferometer
AT xiaozhongwang refractiveindexmeasurementwithhighprecisionbyalaserdiodeselfmixinginterferometer
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