Field Manipulation of Band Properties in Infrared Spectra of Thin Films
This comprehensive optical study analyzes field manipulations of bands in infrared (IR) spectra of thin films and functional surfaces for varying measurement and sample conditions. Band variations related to the materials dielectric functions, the measurement geometry, the film thickness as well as...
Main Authors: | Karsten Hinrichs, Naveen Shetty, Sergey Kubatkin, Per Malmberg, Samuel Lara-Avila, Andreas Furchner, Jörg Rappich |
---|---|
Format: | Article |
Language: | English |
Published: |
Wiley-VCH
2024-01-01
|
Series: | Advanced Photonics Research |
Subjects: | |
Online Access: | https://doi.org/10.1002/adpr.202300212 |
Similar Items
-
Mid‐infrared dual‐comb polarimetry of anisotropic samples
by: Karsten Hinrichs, et al.
Published: (2023-04-01) -
Silicon Channeled Spectropolarimeter for On‐Chip Single‐Detector Stokes Spectroscopy
by: Zhongjin Lin, et al.
Published: (2022-02-01) -
Fully integrated CMOS-compatible polarization analyzer
by: Wu Wenhao, et al.
Published: (2019-01-01) -
Silicon photonic devices for mid-infrared applications
by: Shankar Raji, et al.
Published: (2014-08-01) -
Fano-Resonance Photonic Crystal Membrane Reflectors at Mid- and Far-Infrared
by: Yichen Shuai, et al.
Published: (2013-01-01)