Radiation Hardness of Silicon Carbide upon High-Temperature Electron and Proton Irradiation

The radiation hardness of silicon carbide with respect to electron and proton irradiation and its dependence on the irradiation temperature are analyzed. It is shown that the main mechanism of SiC compensation is the formation of deep acceptor levels. With increasing the irradiation temperature, the...

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Main Authors: Alexander A. Lebedev, Vitali V. Kozlovski, Klavdia S. Davydovskaya, Mikhail E. Levinshtein
Format: Article
Language:English
Published: MDPI AG 2021-08-01
Series:Materials
Subjects:
Online Access:https://www.mdpi.com/1996-1944/14/17/4976
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author Alexander A. Lebedev
Vitali V. Kozlovski
Klavdia S. Davydovskaya
Mikhail E. Levinshtein
author_facet Alexander A. Lebedev
Vitali V. Kozlovski
Klavdia S. Davydovskaya
Mikhail E. Levinshtein
author_sort Alexander A. Lebedev
collection DOAJ
description The radiation hardness of silicon carbide with respect to electron and proton irradiation and its dependence on the irradiation temperature are analyzed. It is shown that the main mechanism of SiC compensation is the formation of deep acceptor levels. With increasing the irradiation temperature, the probability of the formation of these centers decreases, and they are partly annealed out. As a result, the carrier removal rate in SiC becomes ~6 orders of magnitude lower in the case of irradiation at 500 °C. Once again, this proves that silicon carbide is promising as a material for high-temperature electronics devices.
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spelling doaj.art-ede05b7373ea4d82a17f53290b7189242023-11-22T10:54:27ZengMDPI AGMaterials1996-19442021-08-011417497610.3390/ma14174976Radiation Hardness of Silicon Carbide upon High-Temperature Electron and Proton IrradiationAlexander A. Lebedev0Vitali V. Kozlovski1Klavdia S. Davydovskaya2Mikhail E. Levinshtein3Solid State Electronic Department, Ioffe Institute, Politekhnicheskaya Street 26, 194021 St. Petersburg, RussiaDepartment of Experimental Physics, St. Petersburg State Polytechnic University, Polytekhnicheskaya 29, 195251 St. Petersburg, RussiaSolid State Electronic Department, Ioffe Institute, Politekhnicheskaya Street 26, 194021 St. Petersburg, RussiaSolid State Electronic Department, Ioffe Institute, Politekhnicheskaya Street 26, 194021 St. Petersburg, RussiaThe radiation hardness of silicon carbide with respect to electron and proton irradiation and its dependence on the irradiation temperature are analyzed. It is shown that the main mechanism of SiC compensation is the formation of deep acceptor levels. With increasing the irradiation temperature, the probability of the formation of these centers decreases, and they are partly annealed out. As a result, the carrier removal rate in SiC becomes ~6 orders of magnitude lower in the case of irradiation at 500 °C. Once again, this proves that silicon carbide is promising as a material for high-temperature electronics devices.https://www.mdpi.com/1996-1944/14/17/4976silicon carbideradiation hardnessproton and electron irradiationcharge removal ratecompensationirradiation temperature
spellingShingle Alexander A. Lebedev
Vitali V. Kozlovski
Klavdia S. Davydovskaya
Mikhail E. Levinshtein
Radiation Hardness of Silicon Carbide upon High-Temperature Electron and Proton Irradiation
Materials
silicon carbide
radiation hardness
proton and electron irradiation
charge removal rate
compensation
irradiation temperature
title Radiation Hardness of Silicon Carbide upon High-Temperature Electron and Proton Irradiation
title_full Radiation Hardness of Silicon Carbide upon High-Temperature Electron and Proton Irradiation
title_fullStr Radiation Hardness of Silicon Carbide upon High-Temperature Electron and Proton Irradiation
title_full_unstemmed Radiation Hardness of Silicon Carbide upon High-Temperature Electron and Proton Irradiation
title_short Radiation Hardness of Silicon Carbide upon High-Temperature Electron and Proton Irradiation
title_sort radiation hardness of silicon carbide upon high temperature electron and proton irradiation
topic silicon carbide
radiation hardness
proton and electron irradiation
charge removal rate
compensation
irradiation temperature
url https://www.mdpi.com/1996-1944/14/17/4976
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