The effect of different step-size on the visualization of crystallographic defects using SEM/EBSD technique
Crystallographic grains and defects play an important role in many fundamental processes, such as grain growth and recrystallization, damage, and plastic deformation. Due to the importance of these processes, there is considerable interest in characterizing the crystallographic orientation and grain...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
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MULTIPHYSICS
2016-10-01
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| Series: | International Journal of Multiphysics |
| Online Access: | http://journal.multiphysics.org/index.php/IJM/article/view/277 |
| _version_ | 1797720800868958208 |
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| author | Y Higa K Shimojima T Makishi |
| author_facet | Y Higa K Shimojima T Makishi |
| author_sort | Y Higa |
| collection | DOAJ |
| description | Crystallographic grains and defects play an important role in many fundamental processes, such as grain growth and recrystallization, damage, and plastic deformation. Due to the importance of these processes, there is considerable interest in characterizing the crystallographic orientation and grain boundary distribution of crystalline materials. In this study, crystallographic defects such as dislocation arrays and grain boundaries and their orientations were investigated in a commercial polycrystalline copper sample using electron backscatter diffraction (EBSD) mapping combined with scanning electron microscopy (SEM). EBSD was used to determine the local orientations at individual points of a regular grid on a planar surface of a specimen. From the orientation differences between neighboring points, the lattice curvature and dislocation density tensor were derived, and the dislocation density distribution accompanying the crystallographic defects was significantly dependent on the SEM/EBSD step size associated with the spatial resolution. |
| first_indexed | 2024-03-12T09:24:48Z |
| format | Article |
| id | doaj.art-efce531427e8438bb40a3022c53dd6a5 |
| institution | Directory Open Access Journal |
| issn | 1750-9548 2048-3961 |
| language | English |
| last_indexed | 2024-03-12T09:24:48Z |
| publishDate | 2016-10-01 |
| publisher | MULTIPHYSICS |
| record_format | Article |
| series | International Journal of Multiphysics |
| spelling | doaj.art-efce531427e8438bb40a3022c53dd6a52023-09-02T14:18:24ZengMULTIPHYSICSInternational Journal of Multiphysics1750-95482048-39612016-10-019110.1260/1750-9548.9.1.37289The effect of different step-size on the visualization of crystallographic defects using SEM/EBSD techniqueY Higa0K Shimojima1T Makishi2Department of Mechanical Systems Engineering, Okinawa National College of Technology, 905 Henoko, Nago, Okinawa, JapanDepartment of Mechanical Systems Engineering, Okinawa National College of Technology, 905 Henoko, Nago, Okinawa, JapanDepartment of Mechanical Systems Engineering, Okinawa National College of Technology, 905 Henoko, Nago, Okinawa, JapanCrystallographic grains and defects play an important role in many fundamental processes, such as grain growth and recrystallization, damage, and plastic deformation. Due to the importance of these processes, there is considerable interest in characterizing the crystallographic orientation and grain boundary distribution of crystalline materials. In this study, crystallographic defects such as dislocation arrays and grain boundaries and their orientations were investigated in a commercial polycrystalline copper sample using electron backscatter diffraction (EBSD) mapping combined with scanning electron microscopy (SEM). EBSD was used to determine the local orientations at individual points of a regular grid on a planar surface of a specimen. From the orientation differences between neighboring points, the lattice curvature and dislocation density tensor were derived, and the dislocation density distribution accompanying the crystallographic defects was significantly dependent on the SEM/EBSD step size associated with the spatial resolution.http://journal.multiphysics.org/index.php/IJM/article/view/277 |
| spellingShingle | Y Higa K Shimojima T Makishi The effect of different step-size on the visualization of crystallographic defects using SEM/EBSD technique International Journal of Multiphysics |
| title | The effect of different step-size on the visualization of crystallographic defects using SEM/EBSD technique |
| title_full | The effect of different step-size on the visualization of crystallographic defects using SEM/EBSD technique |
| title_fullStr | The effect of different step-size on the visualization of crystallographic defects using SEM/EBSD technique |
| title_full_unstemmed | The effect of different step-size on the visualization of crystallographic defects using SEM/EBSD technique |
| title_short | The effect of different step-size on the visualization of crystallographic defects using SEM/EBSD technique |
| title_sort | effect of different step size on the visualization of crystallographic defects using sem ebsd technique |
| url | http://journal.multiphysics.org/index.php/IJM/article/view/277 |
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