Optimal ultra-miniature polarimeters in silicon photonic integrated circuits
Measurement of the state of polarization of light is essential in a vast number of applications, such as quantum and classical communications, remote sensing, astronomy, and biomedical diagnostics. Nanophotonic structures and integrated photonic circuits can, in many circumstances, replace conventio...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2019-10-01
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| Series: | APL Photonics |
| Online Access: | http://dx.doi.org/10.1063/1.5098492 |
| Summary: | Measurement of the state of polarization of light is essential in a vast number of applications, such as quantum and classical communications, remote sensing, astronomy, and biomedical diagnostics. Nanophotonic structures and integrated photonic circuits can, in many circumstances, replace conventional discrete optical components for miniature polarimeters and chip-scale polarimetry systems and thus significantly improve robustness while minimizing the footprint and cost. We propose and experimentally demonstrate two silicon photonic four-photodetector (PD) division-of-amplitude polarimeters (4PD-DOAPs) using a complementary metal–oxide–semiconductor-compatible photonic fabrication process. The first design targets minimizing the number of optical components. The second design makes use of a slightly more complex circuit design to achieve an optimal frame for measurements; this measurement frame minimizes and equalizes estimation variances in the presence of the additive white Gaussian noise and the signal dependent shot noise. Further theoretical examination reveals that within the optimal measurement frames for Stokes polarimeters, the DOAP with four PDs has the minimal equally weighted variance compared to those with a greater number of PDs. |
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| ISSN: | 2378-0967 |